Inventor · disambiguated record
Kyong-Won An
Also filed as: AN KYONG-WON
10 granted patents·1 pending application·10 citations·filing 2008–2025
82Inventor score
Top patents by PatentIndex Score
11 records- 0188US2025344391A1Three-dimensional semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0283US11569261B2Three-dimensional semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 31, 2023·1 cites·20 claims
- 0381US10720447B2Integrated circuit memory devices having impurity-doped dielectric regions therein and methods of forming sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 21, 2020·2 cites·11 claims
- 0481US10411034B2Integrated circuit memory devices having impurity-doped dielectric regions therein and methods of forming sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 10, 2019·2 cites·20 claims
- 0579US10797074B2Three-dimensional semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 6, 2020·2 cites·18 claims
- 0678US12402314B2Three-dimensional semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 0768US9653472B2Semiconductor device, method of fabricating the semiconductor device, and method of forming epitaxial layerLEE WOONG·Filed 2015·Granted May 16, 2017·2 cites·20 claims
- 0856US9601496B2Semiconductor device having sacrificial layer pattern with concave sidewalls and method fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Mar 21, 2017·1 cites·12 claims
- 0949US7964462B2Method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jun 21, 2011·0 cites·4 claims
- 1048US7790591B2Methods of manufacturing semiconductor devices including metal oxide layersSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Sep 7, 2010·0 cites·9 claims
- 1144US9276132B2Nonvolatile memory device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Mar 1, 2016·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →