Inventor · disambiguated record
Kyoung-Yun Baek
Also filed as: BAEK KYOUNG-YUN
8 granted patents·5 pending applications·17 citations·filing 2005–2015
81Inventor score
Top patents by PatentIndex Score
13 records- 0171US7012031B2Photoresist pattern, method of fabricating the same, and method of assuring the quality thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 14, 2006·6 cites·16 claims
- 0266US8013375B2Semiconductor memory devices including diagonal bit linesSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Sep 6, 2011·4 cites·19 claims
- 0363US9965579B2Method for designing and manufacturing an integrated circuit, system for carrying out the method, and system for verifying an integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted May 8, 2018·1 cites·20 claims
- 0463US8013374B2Semiconductor memory devices including offset bit linesSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Sep 6, 2011·2 cites·16 claims
- 0558US8689150B2Method of fabricating semiconductor deviceJUNG JEE-EUN·Filed 2012·Granted Apr 1, 2014·1 cites·19 claims
- 0656US8084801B2Cell structure for a semiconductor memory device and method of fabricating the sameBAEK KYOUNG-YUN·Filed 2009·Granted Dec 27, 2011·2 cites·8 claims
- 0755US7547936B2Semiconductor memory devices including offset active regionsSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 16, 2009·1 cites·19 claims
- 0843US9431245B2Method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 30, 2016·0 cites·19 claims
- 0939US2007009838A1Method of manufacturing a pattern structure and method of forming a trench using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1038US2007096155A1Cell structure for a semiconductor memory device and method of fabricating the sameBAEK KYOUNG-YUN·Filed 2006·Application pending·0 cites
- 1137US2007007600A1MOS transistor and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1236US2011029936A1Method of generating layout of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2010·Application pending·0 cites
- 1336US2006105476A1Photoresist pattern, method of fabricating the same, and method of assuring the quality thereofCHOI YEON-DONG·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →