Inventor · disambiguated record
Kyu-Chang Park
Also filed as: PARK KYU C · PARK KYU CHANG
21 granted patents·2 pending applications·1,090 citations·filing 1975–2022
96Inventor score
Files withIBM5SAMSUNG KWANGJU ELECTRONICS CO5IND ACADEMIC COOP2UNIV INDUSTRY COOPERATION GROUP KYUNG HEE UNIV2BOE HYDIS TECHNOLOGY CO LTD1
Top patents by PatentIndex Score
23 records- 0198US6406505B1Vacuum cleaner having a cyclone type dust collecting apparatusSAMSUNG KWANGJU ELECTRONICS CO·Filed 2001·Granted Jun 18, 2002·443 cites·6 claims
- 0297US6502278B2Upright type vacuum cleaner having a cyclone type dust collectorFiled 2001·Granted Jan 7, 2003·224 cites·21 claims
- 0396US6546593B2Upright type vacuum cleaner having a cyclone type dust collectorSAMSUNG KWANGJU ELECTRONICS CO·Filed 2001·Granted Apr 15, 2003·94 cites·13 claims
- 0490US7418117B2Liquid crystal display device performing both image display mode and fingerprint recognition modeBOE HYDIS TECHNOLOGY CO LTD·Filed 2002·Granted Aug 26, 2008·50 cites·6 claims
- 0589US4018490AGas discharge display panel fabricationIBM·Filed 1975·Granted Apr 19, 1977·29 cites·19 claims
- 0687US6521006B2Vacuum cleanerSAMSUNG KWANGJU ELECTRONICS CO·Filed 2001·Granted Feb 18, 2003·45 cites·23 claims
- 0782US6578230B2Upright-type vacuum cleaner having a cyclone dust collecting apparatusSAMSUNG KWANGJU ELECTRONICS CO·Filed 2001·Granted Jun 17, 2003·43 cites·5 claims
- 0881US7492088B2Method of forming carbon nanotubes, field emission display device having carbon nanotubes formed through the method, and method of manufacturing field emission display deviceIND ACADEMIC COOP·Filed 2005·Granted Feb 17, 2009·7 cites·5 claims
- 0979US6319760B1Manufacturing method of liquid crystal display having high aperture ratio and high transmittanceHYUNDAI ELECTRONICS IND·Filed 1999·Granted Nov 20, 2001·44 cites·9 claims
- 1076US5939149AMethod of forming hydrogen-free diamond like carbon (DLC) filmsORION ELECTRIC CO LTD·Filed 1996·Granted Aug 17, 1999·30 cites·10 claims
- 1175US6766557B2Upright-type vacuum cleaner having a cyclone dust collecting apparatusSAMSUNG KWANGJU ELECTRONICS CO·Filed 2003·Granted Jul 27, 2004·15 cites·3 claims
- 1275US4104418AGlass layer fabricationIBM·Filed 1976·Granted Aug 1, 1978·28 cites·9 claims
- 1374US8172633B2Field emission display and manufacturing method of the same having selective array of electron emission sourcePARK KYU CHANG·Filed 2007·Granted May 8, 2012·6 cites·30 claims
- 1473US7811641B2Method of forming carbon nanotubes, field emission display device having carbon nanotubes formed through the method, and method of manufacturing field emission display deviceIND ACADEMIC COOP·Filed 2008·Granted Oct 12, 2010·2 cites·22 claims
- 1565US8723806B2Liquid crystal display device performing both image display mode and fingerprint recognition modeKIM CHOONG HOO·Filed 2007·Granted May 13, 2014·8 cites·6 claims
- 1655US4083614AMethod of manufacturing a gas panel assemblyIBM·Filed 1976·Granted Apr 11, 1978·8 cites·8 claims
- 1752US4147958AMulticolor gas discharge display memory panelIBM·Filed 1977·Granted Apr 3, 1979·8 cites·26 claims
- 1848US12451316B2Extreme-ultraviolet light source device using electron beamsWORLDBEAM SOLUTION CO LTD·Filed 2021·Granted Oct 21, 2025·0 cites·10 claims
- 1946US9754758B2X-ray source having cooling and shielding functionsPARK HUN KUK·Filed 2012·Granted Sep 5, 2017·1 cites·12 claims
- 2045US7508962B2Liquid crystal display device performing both image display mode and fingerprint recognition modeHYDIS TECH CO LTD·Filed 2002·Granted Mar 24, 2009·5 cites·6 claims
- 2141US2025040022A1Electron beam-based extreme ultraviolet light source deviceUNIV INDUSTRY COOPERATION GROUP KYUNG HEE UNIV·Filed 2022·Application pending·0 cites
- 2241US2025040023A1Electron beam and droplet-based extreme ultraviolet light source deviceUNIV INDUSTRY COOPERATION GROUP KYUNG HEE UNIV·Filed 2022·Application pending·0 cites
- 2330US4065840AMethod for fabricating a DSDT targetIBM·Filed 1976·Granted Jan 3, 1978·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →