Inventor · disambiguated record
Kyeong-Seon Shin
Also filed as: SHIN KYEONG-SEON
14 granted patents·82 citations·filing 2002–2008
91Inventor score
Files withSAMSUNG ELECTRONICS CO LTD14
Top patents by PatentIndex Score
14 records- 0179US7633288B2Method of testing semiconductor devices and handler used for testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 15, 2009·7 cites·11 claims
- 0278US6903567B2Test apparatus having multiple test sites at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 7, 2005·17 cites·3 claims
- 0376US7378864B2Test apparatus having multiple test sites at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted May 27, 2008·4 cites·4 claims
- 0474US7230417B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 12, 2007·5 cites·23 claims
- 0572US7689876B2Real-time optimized testing of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 30, 2010·6 cites·20 claims
- 0663US7671361B2Semiconductor device including fuse focus detector, fabricating method thereof and laser repair method using the fuse focus detectorSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Mar 2, 2010·3 cites·13 claims
- 0763US7602172B2Test apparatus having multiple head boards at one handler and its test methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Oct 13, 2009·1 cites·4 claims
- 0863US6960908B2Method for electrical testing of semiconductor package that detects socket defects in real timeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Nov 1, 2005·14 cites·13 claims
- 0962US7492032B2Fuse regions of a semiconductor memory device and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 17, 2009·4 cites·17 claims
- 1058US6850450B2Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cellSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Feb 1, 2005·10 cites·15 claims
- 1155US6861682B2Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 1, 2005·7 cites·14 claims
- 1250US7408339B2Test system of semiconductor device having a handler remote control and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 5, 2008·1 cites·12 claims
- 1345US6972612B2Semiconductor device with malfunction control circuit and controlling method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Dec 6, 2005·2 cites·6 claims
- 1444US6922050B2Method for testing a remnant batch of semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 26, 2005·1 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →