Inventor · disambiguated record
Laszlo Landstein
Also filed as: LANDSTEIN LASZLO
3 granted patents·220 citations·filing 1991–1993
78Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0193US5298975ACombined scanning force microscope and optical metrology toolIBM·Filed 1991·Granted Mar 29, 1994·130 cites·29 claims
- 0284US5345816AIntegrated tip strain sensor for use in combination with a single axis atomic force microscopeIBM·Filed 1993·Granted Sep 13, 1994·45 cites·12 claims
- 0380US5321977AIntegrated tip strain sensor for use in combination with a single axis atomic force microscopeIBM·Filed 1992·Granted Jun 21, 1994·45 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →