Inventor · disambiguated record
Lakshminarayana Pappu
Also filed as: Pappu Lakshminarayana
40 granted patents·8 pending applications·60 citations·filing 2015–2025
95Inventor score
Top patents by PatentIndex Score
48 records- 0193US9972611B2Stacked semiconductor package having fault detection and a method for identifying a fault in a stacked packageINTEL CORP·Filed 2017·Granted May 15, 2018·27 cites·24 claims
- 0290US9995785B2Stacked semiconductor package and method for performing bare die testing on a functional die in a stacked semiconductor packageINTEL CORP·Filed 2017·Granted Jun 12, 2018·10 cites·25 claims
- 0385US10739836B2System, apparatus and method for handshaking protocol for low power state transitionsINTEL CORP·Filed 2018·Granted Aug 11, 2020·4 cites·20 claims
- 0478US10056155B2Systems, methods, and apparatuses for implementing testing of a far memory subsystem within two-level memory (2LM) stacked die subsystemsINTEL CORP·Filed 2017·Granted Aug 21, 2018·3 cites·25 claims
- 0578US2025321844A1Infrastructure for platform immersive experienceINTEL CORP·Filed 2025·Application pending·0 cites
- 0676US10732699B2Redundancy in distribution of voltage-frequency scaling parametersINTEL CORP·Filed 2018·Granted Aug 4, 2020·2 cites·14 claims
- 0775US10249597B2Systems, methods, and apparatuses for implementing die recovery in two-level memory (2LM) stacked die subsystemsINTEL CORP·Filed 2016·Granted Apr 2, 2019·3 cites·28 claims
- 0874US10127162B2Efficient low cost on-die configurable bridge controllerINTEL CORP·Filed 2016·Granted Nov 13, 2018·2 cites·19 claims
- 0973US10484361B2Systems, methods, and apparatuses for implementing a virtual device observation and debug network for high speed serial IOSINTEL CORP·Filed 2016·Granted Nov 19, 2019·2 cites·25 claims
- 1071US10613955B2Platform debug and testing with secured hardwareINTEL CORP·Filed 2017·Granted Apr 7, 2020·1 cites·20 claims
- 1170US12339728B2Dynamic voltage and frequency scaling for discrete graphics systemsINTEL CORP·Filed 2022·Granted Jun 24, 2025·0 cites·20 claims
- 1268US10204025B2Mechanism to provide back-to-back testing of memory controller operationINTEL CORP·Filed 2017·Granted Feb 12, 2019·1 cites·20 claims
- 1367US11231927B2System, apparatus and method for providing a fabric for an acceleratorINTEL CORP·Filed 2018·Granted Jan 25, 2022·1 cites·20 claims
- 1467US10705142B2Device, system and method for providing on-chip test/debug functionalityINTEL CORP·Filed 2016·Granted Jul 7, 2020·1 cites·20 claims
- 1566US12353313B2Infrastructure for platform immersive experienceINTEL CORP·Filed 2021·Granted Jul 8, 2025·0 cites·20 claims
- 1664US12373348B2Atomic handling for disaggregated 3D structured SoCsINTEL CORP·Filed 2021·Granted Jul 29, 2025·0 cites·20 claims
- 1763US10657092B2Innovative high speed serial controller testingINTEL CORP·Filed 2016·Granted May 19, 2020·1 cites·27 claims
- 1862US10664433B2Innovative high speed serial controller testingINTEL CORP·Filed 2016·Granted May 26, 2020·1 cites·26 claims
- 1961US12461878B2System, method, apparatus and architecture for dynamically configuring device fabricsINTEL CORP·Filed 2021·Granted Nov 4, 2025·0 cites·20 claims
- 2061US12386760B2System-on-a-chip (SoC) architecture for low power state communicationINTEL CORP·Filed 2021·Granted Aug 12, 2025·0 cites·20 claims
- 2160US12117878B2Methods and apparatus to reduce display connection latencyINTEL CORP·Filed 2022·Granted Oct 15, 2024·0 cites·25 claims
- 2258US2025383923A1Workload scheduling based on voltage droop characteristicsADVANCED MICRO DEVICES INC·Filed 2024·Application pending·0 cites
- 2355US10901035B2Techniques in ensuring functional safety (fusa) systemsINTEL CORP·Filed 2019·Granted Jan 26, 2021·0 cites·17 claims
- 2455US10042729B2Apparatus and method for a scalable test enginePappu Lakshminarayana·Filed 2016·Granted Aug 7, 2018·1 cites·25 claims
- 2555US2025111121A1Runtime optimization of active interposer dies from difference process binsADVANCED MICRO DEVICES INC·Filed 2023·Application pending·0 cites
- 2652US12425678B2Low latency communication path for audio/visual (A/V) applicationsINTEL CORP·Filed 2021·Granted Sep 23, 2025·0 cites·20 claims
- 2752US11105854B2System, apparatus and method for inter-die functional testing of an integrated circuitINTEL CORP·Filed 2017·Granted Aug 31, 2021·0 cites·20 claims
- 2852US10410560B2Display controller testing through high speed communications switchINTEL CORP·Filed 2017·Granted Sep 10, 2019·0 cites·20 claims
- 2951US11042315B2Dynamically programmable memory test traffic routerINTEL CORP·Filed 2018·Granted Jun 22, 2021·0 cites·22 claims
- 3051US10725097B2Platform component interconnect testingINTEL CORP·Filed 2016·Granted Jul 28, 2020·0 cites·20 claims
- 3150US10691249B2Touch host controllerINTEL CORP·Filed 2017·Granted Jun 23, 2020·0 cites·20 claims
- 3250US2022121594A1Soc architecture to reduce memory bandwidth bottlenecks and facilitate power managementINTEL CORP·Filed 2021·Application pending·0 cites
- 3349US11686767B2System, apparatus and method for functional testing of one or more fabrics of a processorINTEL CORP·Filed 2017·Granted Jun 27, 2023·0 cites·20 claims
- 3449US10417170B2Device, system and method for packet processing to facilitate circuit testingINTEL CORP·Filed 2017·Granted Sep 17, 2019·0 cites·21 claims
- 3549US10379980B2Maintaining IO block operation in electronic systems for board testingINTEL CORP·Filed 2017·Granted Aug 13, 2019·0 cites·21 claims
- 3648US12418478B2Interconnect network for multi-tile system on chipsINTEL CORP·Filed 2021·Granted Sep 16, 2025·0 cites·19 claims
- 3748US10346265B2Protocol aware testing engine for high speed link integrity testingINTEL CORP·Filed 2016·Granted Jul 9, 2019·0 cites·17 claims
- 3847US10430314B2Firmware fingerprinting based on data monitored during firmware loadingINTEL CORP·Filed 2016·Granted Oct 1, 2019·0 cites·25 claims
- 3946US10192633B2Low cost inbuilt deterministic tester for SOC testingINTEL CORP·Filed 2016·Granted Jan 29, 2019·0 cites·14 claims
- 4046US2022113967A1Accelerator fabric for discrete graphicsINTEL CORP·Filed 2021·Application pending·0 cites
- 4144US9971644B2Serial I/O functional testerINTEL CORP·Filed 2015·Granted May 15, 2018·0 cites·21 claims
- 4243US2019052539A1Programmable tester for master-slave device networksINTEL CORP·Filed 2018·Application pending·0 cites
- 4341US10303237B2Phase lock loop bypass for board-level testing of systemsINTEL CORP·Filed 2017·Granted May 28, 2019·0 cites·22 claims
- 4440US9891282B2Chip fabric interconnect quality on siliconINTEL CORP·Filed 2015·Granted Feb 13, 2018·0 cites·20 claims
- 4540US2019042487A1High-bandwidth, low-latency, isochoronous fabric for graphics acceleratorINTEL CORP·Filed 2017·Application pending·0 cites
- 4638US10319453B2Board level leakage testing for memory interfaceINTEL CORP·Filed 2017·Granted Jun 11, 2019·0 cites·22 claims
- 4738US10185695B2Device, system and method for on-chip testing of protocol stack circuitryINTEL CORP·Filed 2017·Granted Jan 22, 2019·0 cites·21 claims
- 4837US2018181757A1Firmware loader for electronic devicesINTEL CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →