Inventor · disambiguated record
Larry E. Plew
Also filed as: PLEW LARRY E
13 granted patents·2 pending applications·172 citations·filing 1997–2002
92Inventor score
Top patents by PatentIndex Score
15 records- 0187US6651226B2Process control using three dimensional reconstruction metrologyAGERE SYSTEMS INC·Filed 2001·Granted Nov 18, 2003·29 cites·20 claims
- 0277US6714892B2Three dimensional reconstruction metrologyAGERE SYSTEMS INC·Filed 2001·Granted Mar 30, 2004·15 cites·20 claims
- 0376US6250143B1Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-sectionAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 26, 2001·50 cites·12 claims
- 0470US6606371B2X-ray systemAGERE SYSTEMS INC·Filed 2000·Granted Aug 12, 2003·11 cites·10 claims
- 0568US6727720B2Probe having a microstyletAGERE SYSTEMS INC·Filed 2001·Granted Apr 27, 2004·14 cites·11 claims
- 0664US6577970B2Method of determining a crystallographic quality of a material located on a substrateAGERE SYSTEMS INC·Filed 2001·Granted Jun 10, 2003·5 cites·20 claims
- 0754US6246060B1Apparatus for holding and aligning a scanning electron microscope sampleAGERE SYST GUARDIAN CORP·Filed 1998·Granted Jun 12, 2001·13 cites·12 claims
- 0850US6695572B2Method and apparatus for minimizing semiconductor wafer contaminationAGERE SYSTEMS INC·Filed 2001·Granted Feb 24, 2004·4 cites·1 claims
- 0948US6405584B1Probe for scanning probe microscopy and related methodsAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jun 18, 2002·14 cites·43 claims
- 1047US5804460ALinewidth metrology of integrated circuit structuresLUCENT TECHNOLOGIES INC·Filed 1997·Granted Sep 8, 1998·17 cites·10 claims
- 1140US6713409B2Semiconductor manufacturing using modular substratesAGERE SYSTEMS INC·Filed 2002·Granted Mar 30, 2004·0 cites·14 claims
- 1239US6534851B1Modular semiconductor substratesAGERE SYSTEMS INC·Filed 2000·Granted Mar 18, 2003·0 cites·27 claims
- 1336US2002150509A1Laboratory specimen sampler with integrated specimen mountFiled 2001·Application pending·0 cites
- 1435US6425189B1Probe tip locator having improved marker arrangement for reduced bit encoding errorAGERE SYST GUARDIAN CORP·Filed 2000·Granted Jul 30, 2002·0 cites·21 claims
- 1533US2002062572A1Method of determining the shape of a probe for a stylus profilometerFiled 2000·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Larry E. Plew files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →