Inventor · disambiguated record
Lewis A. Binns
Also filed as: BINNS LEWIS A
5 granted patents·115 citations·filing 2005–2010
83Inventor score
Technology areasG03F
Top patents by PatentIndex Score
5 records- 0196US7474401B2Multi-layer alignment and overlay target and measurement methodIBM·Filed 2005·Granted Jan 6, 2009·38 cites·32 claims
- 0294US8339605B2Multilayer alignment and overlay target and measurement methodAUSSCHNITT CHRISTOPHER P·Filed 2010·Granted Dec 25, 2012·11 cites·4 claims
- 0390US8107079B2Multi layer alignment and overlay target and measurement methodAUSSCHNITT CHRISTOPHER P·Filed 2010·Granted Jan 31, 2012·6 cites·19 claims
- 0490US7473502B1Imaging tool calibration artifact and methodIBM·Filed 2007·Granted Jan 6, 2009·52 cites·20 claims
- 0589US7876439B2Multi layer alignment and overlay target and measurement methodIBM·Filed 2008·Granted Jan 25, 2011·8 cites·34 claims
Join the waitlist — get patent alerts
Get an alert when Lewis A. Binns files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →