Inventor · disambiguated record
Leoncio D. Lopez
Also filed as: LOPEZ LEONCIO D
14 granted patents·3 pending applications·92 citations·filing 2005–2011
90Inventor score
Files withSUN MICROSYSTEMS INC9ORACLE AMERICA INC3LOPEZ LEONCIO D2MCELFRESH DAVID K2URMANOV ALEKSEY M1
Top patents by PatentIndex Score
17 records- 0189US7162393B1Detecting degradation of components during reliability-evaluation studiesSUN MICROSYSTEMS INC·Filed 2005·Granted Jan 9, 2007·23 cites·21 claims
- 0286US7184932B1Reliability prediction for complex componentsSUN MICROSYSTEMS INC·Filed 2006·Granted Feb 27, 2007·17 cites·20 claims
- 0382US7870440B2Method and apparatus for detecting multiple anomalies in a cluster of componentsORACLE AMERICA INC·Filed 2008·Granted Jan 11, 2011·12 cites·23 claims
- 0481US7216062B1Characterizing degradation of components during reliability-evaluation studiesSUN MICROSYSTEMS INC·Filed 2006·Granted May 8, 2007·11 cites·20 claims
- 0579US7283919B2Determining the quality and reliability of a component by monitoring dynamic variablesSUN MICROSYSTEMS INC·Filed 2006·Granted Oct 16, 2007·9 cites·15 claims
- 0676US7353431B2Method and apparatus for proactive fault monitoring in interconnectsSUN MICROSYSTEMS INC·Filed 2006·Granted Apr 1, 2008·8 cites·18 claims
- 0765US7680624B2Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signalsSUN MICROSYSTEMS INC·Filed 2007·Granted Mar 16, 2010·3 cites·15 claims
- 0858US7800385B2Apparatus and method for testing electrical interconnectsORACLE AMERICA INC·Filed 2008·Granted Sep 21, 2010·3 cites·20 claims
- 0957US7466404B1Technique for diagnosing and screening optical interconnect light sourcesSUN MICROSYSTEMS INC·Filed 2005·Granted Dec 16, 2008·3 cites·24 claims
- 1053US7982468B2Apparatus and method for testing electrical interconnects with switchesORACLE AMERICA INC·Filed 2008·Granted Jul 19, 2011·2 cites·17 claims
- 1150US8140277B2Enhanced characterization of electrical connection degradationMCELFRESH DAVID K·Filed 2009·Granted Mar 20, 2012·1 cites·17 claims
- 1249US8798944B2Estimating ball-grid-array longevity in a computer systemURMANOV ALEKSEY M·Filed 2009·Granted Aug 5, 2014·0 cites·21 claims
- 1347US2009326864A1Determining the reliability of an interconnectSUN MICROSYSTEMS INC·Filed 2008·Application pending·0 cites
- 1444US8155765B2Estimating relative humidity inside a computer systemLOPEZ LEONCIO D·Filed 2008·Granted Apr 10, 2012·0 cites·18 claims
- 1540US9229045B2In-situ characterization of a solid-state light sourceMCELFRESH DAVID K·Filed 2008·Granted Jan 5, 2016·0 cites·14 claims
- 1636US2008061812A1Component-attach test vehicleSUN MICROSYSTEMS INC·Filed 2006·Application pending·0 cites
- 1735US2013138419A1Method and system for the assessment of computer system reliability using quantitative cumulative stress metricsLOPEZ LEONCIO D·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →