Inventor · disambiguated record
Leland R. Nevill
Also filed as: NEVILL LELAND R
58 granted patents·4 pending applications·2,504 citations·filing 1988–2014
99Inventor score
Files withMICRON TECHNOLOGY INC58
Top patents by PatentIndex Score
62 records- 0199US6198172B1Semiconductor chip packageMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 6, 2001·203 cites·24 claims
- 0297US6246108B1Integrated circuit package including lead frame with electrically isolated alignment featureMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 12, 2001·273 cites·20 claims
- 0397US6048744AIntegrated circuit package alignment featureMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 11, 2000·275 cites·6 claims
- 0494US6636068B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 21, 2003·40 cites·15 claims
- 0594US6424168B1Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 23, 2002·45 cites·11 claims
- 0693US6534785B1Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 18, 2003·42 cites·3 claims
- 0793US5910921ASelf-test of a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 8, 1999·105 cites·31 claims
- 0892US6452415B1Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 17, 2002·29 cites·15 claims
- 0991US7567091B2Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2008·Granted Jul 28, 2009·11 cites·4 claims
- 1091US6313658B1Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor waferMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 6, 2001·48 cites·17 claims
- 1191US6233185B1Wafer level burn-in of memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·88 cites·28 claims
- 1291US5982682ASelf-test circuit for memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 9, 1999·87 cites·31 claims
- 1391US5898186AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1996·Granted Apr 27, 1999·71 cites·36 claims
- 1490US6292009B1Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 18, 2001·58 cites·11 claims
- 1590US5994915AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 30, 1999·68 cites·8 claims
- 1690US4879631AShort-resistant decoupling capacitor system for semiconductor circuitsMICRON TECHNOLOGY INC·Filed 1989·Granted Nov 7, 1989·59 cites·15 claims
- 1789US6058056AData compression circuit and method for testing memory devicesMICRON TECHNOLOGY INC·Filed 1998·Granted May 2, 2000·78 cites·14 claims
- 1887US5984190AMethod and apparatus for identifying integrated circuitsMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 16, 1999·77 cites·22 claims
- 1987US4926117ABurn-in board having discrete test capabilityMICRON TECHNOLOGY INC·Filed 1988·Granted May 15, 1990·50 cites·27 claims
- 2086US6118138AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 12, 2000·46 cites·3 claims
- 2186US5825697ACircuit and method for enabling a function in a multiple memory device moduleMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 20, 1998·56 cites·57 claims
- 2286US5307309AMemory module having on-chip surge capacitorsMICRON TECHNOLOGY INC·Filed 1993·Granted Apr 26, 1994·76 cites·19 claims
- 2385US5754486ASelf-test circuit for memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1997·Granted May 19, 1998·55 cites·44 claims
- 2484US7276926B2Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 2, 2007·6 cites·20 claims
- 2583US6831475B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 14, 2004·14 cites·13 claims
- 2683US6119251ASelf-test of a memory deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 12, 2000·50 cites·68 claims
- 2781US9483370B2Error detection/correction based memory managementMICRON TECHNOLOGY INC·Filed 2014·Granted Nov 1, 2016·6 cites·13 claims
- 2881US5852581AMethod of stress testing memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 22, 1998·42 cites·23 claims
- 2979US5903163AApparatus and method of controlling the environmental temperature near semiconductor devices under testMICRON TECHNOLOGY INC·Filed 1996·Granted May 11, 1999·45 cites·21 claims
- 3078US6852999B2Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 8, 2005·11 cites·3 claims
- 3178US5976899AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 2, 1999·31 cites·1 claims
- 3277US7276927B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 2, 2007·4 cites·15 claims
- 3376US6836003B2Integrated circuit package alignment featureMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 28, 2004·17 cites·8 claims
- 3476US5898629ASystem for stressing a memory integrated circuit dieMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 27, 1999·31 cites·58 claims
- 3575US7034561B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 25, 2006·9 cites·13 claims
- 3674US7323896B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 29, 2008·3 cites·16 claims
- 3774US7212020B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted May 1, 2007·3 cites·4 claims
- 3873US7315179B2System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 1, 2008·3 cites·14 claims
- 3973US5687109AIntegrated circuit module having on-chip surge capacitorsMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 11, 1997·23 cites·39 claims
- 4071US5927503ATray for processing and/or shipping integrated circuit deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 27, 1999·33 cites·25 claims
- 4170US5935264AMethod and apparatus for determining a set of tests for integrated circuit testingMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 10, 1999·29 cites·24 claims
- 4268US6094734ATest arrangement for memory devices using a dynamic row for creating test dataMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 25, 2000·27 cites·26 claims
- 4367US6003149ATest method and apparatus for writing a memory array with a reduced number of cyclesMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 14, 1999·26 cites·35 claims
- 4464US6184568B1Integrated circuit module having on-chip surge capacitorsMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 6, 2001·15 cites·10 claims
- 4562US5731230AMethod for processing and/or shipping integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 24, 1998·23 cites·16 claims
- 4661USRE38956EData compression circuit and method for testing memory devicesMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 31, 2006·11 cites·29 claims
- 4759US6420195B1Method of aligning and testing a semiconductor chip packageMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 16, 2002·14 cites·8 claims
- 4859US6114868AUniform temperature environmental testing method for semiconductor devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 5, 2000·17 cites·11 claims
- 4956US5764574AMethod and apparatus for back-end repair of multi-chip modulesFiled 1996·Granted Jun 9, 1998·17 cites·17 claims
- 5055US5920516ACircuit and method for enabling a function in a multiple memory device moduleMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 6, 1999·13 cites·18 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →