Inventor · disambiguated record
Lei Ran
Also filed as: RAN LEI
1 granted patent·1 pending application·0 citations·filing 2023–2023
7Inventor score
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2 records- 0154US12360070B2In-situ evaluation method and system for loess collapsibility based on non-destructive time-domain reflection technologyCHINA JIKAN RES INSTITUTE OF ENGINEERING INVESTIGATIONS AND DESIGN CO LTD·Filed 2023·Granted Jul 15, 2025·0 cites·10 claims
- 0250US2024102955A1Non-invasive time domain reflection probe calibration method and systemCHINA JIKAN RES INSTITUTE OF ENGINEERING INVESTIGATIONS AND DESIGN CO LTD·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →