Inventor · disambiguated record
Leslie George Stanton
Also filed as: STANTON LESLIE G · STANTON LESLIE GEORGE
4 granted patents·1 pending application·41 citations·filing 1995–2018
70Inventor score
Technology areasH10P
Top patents by PatentIndex Score
5 records- 0166US5592295AApparatus and method for semiconductor wafer edge inspectionMEMC ELECTRONIC MATERIALS·Filed 1995·Granted Jan 7, 1997·37 cites·20 claims
- 0263US10381260B2Method of manufacturing high resistivity semiconductor-on-insulator wafers with charge trapping layersSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2015·Granted Aug 13, 2019·1 cites·18 claims
- 0348US10381261B2Method of manufacturing high resistivity semiconductor-on-insulator wafers with charge trapping layersSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2018·Granted Aug 13, 2019·0 cites·45 claims
- 0445US6649883B2Method of calibrating a semiconductor wafer drying apparatusMEMC ELECTRONIC MATERIALS·Filed 2001·Granted Nov 18, 2003·3 cites·29 claims
- 0528US2002142617A1Method for evaluating a wafer cleaning operationFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →