Inventor · disambiguated record
Leon C. Vandervalk
Also filed as: VANDERVALK LEON · VANDERVALK LEON C
18 granted patents·1 pending application·675 citations·filing 1991–2017
95Inventor score
Top patents by PatentIndex Score
19 records- 0194US5723791AHigh resolution ultrasonic coating thickness gaugeDEFELSKO CORP·Filed 1993·Granted Mar 3, 1998·76 cites·35 claims
- 0294US5343146ACombination coating thickness gauge using a magnetic flux density sensor and an eddy current search coilFELSKO CORP DE·Filed 1992·Granted Aug 30, 1994·144 cites·20 claims
- 0389USRE35703ECombination coating thickness gauge using a magnetic flux density sensor and an eddy current search coilDEFELSKO CORP·Filed 1996·Granted Dec 30, 1997·70 cites·21 claims
- 0485US5325430AEncryption apparatus for computer deviceTOVEN TECHNOLOGIES INC·Filed 1991·Granted Jun 28, 1994·138 cites·26 claims
- 0575US5686831AGauge with reversible display screenDEFELSKO CORP·Filed 1996·Granted Nov 11, 1997·46 cites·1 claims
- 0674US5777230ADelay line for an ultrasonic probe and method of using sameDEFELSKO CORP·Filed 1995·Granted Jul 7, 1998·34 cites·27 claims
- 0773US5930744ACoating thickness gaugeDEFELSKO CORP·Filed 1995·Granted Jul 27, 1999·31 cites·30 claims
- 0865US6122968ADelay line for an ultrasonic probe and method of using sameDEFELSKO CORP·Filed 1999·Granted Sep 26, 2000·21 cites·7 claims
- 0962US6282962B1High resolution ultrasonic thickness gaugeDEFELSKO CORP·Filed 1997·Granted Sep 4, 2001·19 cites·17 claims
- 1061US6343510B1Ultrasonic testing using synthetic impulsesVN INSTR LTD·Filed 1999·Granted Feb 5, 2002·57 cites·4 claims
- 1159US9188672B2Ultrasonic measuring gaugeVANDERVALK LEON·Filed 2012·Granted Nov 17, 2015·2 cites·25 claims
- 1255US5623427ANondestructive anodic capacity gaugeDEFELSKO CORP·Filed 1994·Granted Apr 22, 1997·18 cites·10 claims
- 1353USRE41342ECoating thickness gaugeDEFELSKO CORP·Filed 2000·Granted May 18, 2010·5 cites·43 claims
- 1452US6250160B1High resolution ultrasonic thickness gaugeDEFELSKO CORP·Filed 1998·Granted Jun 26, 2001·12 cites·16 claims
- 1550US9207174B2Apparatus and method for characterizing a replica tapeDEFELSKO CORP·Filed 2015·Granted Dec 8, 2015·0 cites·29 claims
- 1648US8994933B2Apparatus and method for characterizing a replica tapeDEFELSKO CORP·Filed 2014·Granted Mar 31, 2015·0 cites·41 claims
- 1746US10514328B2Method and system for testing surfaces for contaminantsDEFELSKO CORP·Filed 2017·Granted Dec 24, 2019·0 cites·19 claims
- 1844US2014278257A1Probe communications module and a computing deviceDEFELSKO CORP·Filed 2014·Application pending·0 cites
- 1934US5979241ADelay line for an ultrasonic probe and method of using sameDEFELSKO CORP·Filed 1998·Granted Nov 9, 1999·2 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →