Inventor · disambiguated record
Liang-Yao Lee
Also filed as: LEE LIANG-YAO
18 granted patents·1 pending application·34 citations·filing 2013–2024
91Inventor score
Top patents by PatentIndex Score
19 records- 0191US9984191B2Cell layout and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 29, 2018·13 cites·20 claims
- 0287US10325849B2Different scaling ratio in FEOL/ MOL/ BEOLTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jun 18, 2019·4 cites·20 claims
- 0387US9292649B2Different scaling ratio in FEOL / MOL/ BEOLTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Mar 22, 2016·6 cites·20 claims
- 0487US9136168B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Sep 15, 2015·5 cites·20 claims
- 0586US2024371765A1Different scaling ratio in feol / mol/ beolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0684US11152303B2Different scaling ratio in FEOL / MOL/ BEOLTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 19, 2021·2 cites·20 claims
- 0781US9508791B2Semiconductor device having a metal gateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Nov 29, 2016·3 cites·20 claims
- 0876US12322701B2Different scaling ratio in FEOL / MOL/ BEOLTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 3, 2025·0 cites·20 claims
- 0968US11281835B2Cell layout and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 22, 2022·0 cites·20 claims
- 1067US9746783B2Method for preventing photoresist corner rounding effectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 29, 2017·1 cites·20 claims
- 1165US10998304B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 4, 2021·0 cites·20 claims
- 1260US10664639B2Cell layout and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 26, 2020·0 cites·20 claims
- 1359US10269785B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 23, 2019·0 cites·20 claims
- 1456US9472501B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 18, 2016·0 cites·20 claims
- 1554US9391056B2Mask optimization for multi-layer contactsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 12, 2016·0 cites·20 claims
- 1654US9087773B2Implant region definitionTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 21, 2015·0 cites·20 claims
- 1750US10283495B2Mask optimization for multi-layer contactsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted May 7, 2019·0 cites·20 claims
- 1850US9637818B2Implant region definitionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 2, 2017·0 cites·13 claims
- 1937US10366900B2Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 30, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →