Inventor · disambiguated record
Lihua Lei
Also filed as: LEI LIHUA
7 granted patents·2 pending applications·19 citations·filing 2018–2024
79Inventor score
Files withGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD7SHANGHAI INST MEASUREMENT & TESTING TECH1SHANGHAI INSTITUE OF MEASUREMENT AND TESTING TECH1
Top patents by PatentIndex Score
9 records- 0193US11009684B2Optical imaging lensGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD·Filed 2019·Granted May 18, 2021·8 cites·20 claims
- 0292US10509206B2Optical imaging lensGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD·Filed 2018·Granted Dec 17, 2019·7 cites·20 claims
- 0383US10761298B2Optical imaging lensGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD·Filed 2018·Granted Sep 1, 2020·4 cites·20 claims
- 0483US2024345370A1Optical imaging lensGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD·Filed 2024·Application pending·0 cites
- 0579US12000994B2Optical imaging lensGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD·Filed 2023·Granted Jun 4, 2024·0 cites·20 claims
- 0672US11579419B2Optical imaging lensGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD·Filed 2021·Granted Feb 14, 2023·0 cites·20 claims
- 0742US10830996B2Optical imaging lensGENIUS ELECTRONIC OPTICAL XIAMEN CO LTD·Filed 2018·Granted Nov 10, 2020·0 cites·20 claims
- 0840US12332195B2Method for calibrating parameter error of electron probe microanalysis instrumentSHANGHAI INST MEASUREMENT & TESTING TECH·Filed 2022·Granted Jun 17, 2025·0 cites·14 claims
- 0940US2024393560A1Adjustment method and adjustment apparatus for mutual parallelism of two back-to-back gratingsSHANGHAI INSTITUE OF MEASUREMENT AND TESTING TECH·Filed 2023·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Lihua Lei files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →