Inventor · disambiguated record
Lianjie Li
Also filed as: LI LIANJIE
4 granted patents·7 pending applications·2 citations·filing 2021–2025
62Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD11
Top patents by PatentIndex Score
11 records- 0191US11764297B2LDMOS with enhanced safe operating area and method of manufactureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 19, 2023·2 cites·20 claims
- 0278US12237413B2LDMOS with enhanced safe operating area and method of manufactureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Feb 25, 2025·0 cites·20 claims
- 0374US2025185284A1Integrated circuit, method of fabricating the same, and method of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0469US11444194B2LDMOS with enhanced safe operating area and method of manufactureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 13, 2022·0 cites·20 claims
- 0562US2025359264A1Lateral diffusion metal oxide semiconductor (ldmos) transistor and method of makingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0656US12206038B2Pin diode detector, method of making the same, and system including the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jan 21, 2025·0 cites·20 claims
- 0756US2025133804A1Lateral diffusion metal oxide semiconductor (ldmos) transistor and method of makingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0851US2025248087A1Integrated circuit and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0951US2025267891A1Lateral diffused semiconductor device and forming method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1051US2025169203A1Pin diode detector, method of making the same, and system including the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1148US2025212486A1Converter and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →