Inventor · disambiguated record
Li-Han Lin
Also filed as: LIN LI HAN
11 granted patents·1 pending application·1 citations·filing 2016–2024
80Inventor score
Top patents by PatentIndex Score
12 records- 0183US11488957B1Semiconductor structure and method for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2021·Granted Nov 1, 2022·1 cites·19 claims
- 0280US12243908B2Semiconductor structures having deep trench capacitor and methods for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2024·Granted Mar 4, 2025·0 cites·5 claims
- 0379US12284816B2Semiconductor structures having deep trench capacitor and methods for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2024·Granted Apr 22, 2025·0 cites·11 claims
- 0475US12148791B2Semiconductor structures having deep trench capacitor and methods for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2023·Granted Nov 19, 2024·0 cites·7 claims
- 0572US12183778B2Semiconductor structures having deep trench capacitor and methods for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2022·Granted Dec 31, 2024·0 cites·15 claims
- 0669US12500165B2Semiconductor structure and method of forming the sameNANYA TECHNOLOGY CORP·Filed 2023·Granted Dec 16, 2025·0 cites·11 claims
- 0755US12315734B2Method for manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2022·Granted May 27, 2025·0 cites·15 claims
- 0855US12211739B2Method for manufacturing semiconductor device comprising contact void surrounding bit lineNANYA TECHNOLOGY CORP·Filed 2022·Granted Jan 28, 2025·0 cites·15 claims
- 0955US2025246484A1Manufacturing method of semiconductor structureNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1053US12278142B2Method for manfacturing semiconductor device for reducing partcle-induced defectsNANYA TECHNOLOGY CORP·Filed 2022·Granted Apr 15, 2025·0 cites·14 claims
- 1153US12272561B2Method for manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2022·Granted Apr 8, 2025·0 cites·11 claims
- 1235US10447903B2Positioning device for assembly of image capturing moduleLITE ON ELECTRONICS GUANGZHOU·Filed 2016·Granted Oct 15, 2019·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →