Inventor · disambiguated record
Lih-Wei Lin
Also filed as: LIN LIH WEI
21 granted patents·7 pending applications·38 citations·filing 2004–2025
91Inventor score
Top patents by PatentIndex Score
28 records- 0193US9691980B1Method for forming memory deviceWINBOND ELECTRONICS CORP·Filed 2016·Granted Jun 27, 2017·11 cites·10 claims
- 0291US10439829B1Physical unclonable function code generating method and providing apparatus thereofWINBOND ELECTRONICS CORP·Filed 2019·Granted Oct 8, 2019·9 cites·12 claims
- 0377US11175988B2Memory storage device and data access methodWINBOND ELECTRONICS CORP·Filed 2020·Granted Nov 16, 2021·1 cites·20 claims
- 0465US10347336B1Method for obtaining optimal operating condition of resistive random access memoryWINBOND ELECTRONICS CORP·Filed 2018·Granted Jul 9, 2019·2 cites·15 claims
- 0565US2025362343A1Built-in self-test device and error detection methodWINBOND ELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 0664US9627059B2Resistive memory and data writing method for memory cell thereofWINBOND ELECTRONICS CORP·Filed 2015·Granted Apr 18, 2017·2 cites·8 claims
- 0761US10490272B2Operating method of resistive memory elementWINBOND ELECTRONICS CORP·Filed 2018·Granted Nov 26, 2019·1 cites·9 claims
- 0859US10468100B1Detecting method for a resistive random access memory cellWINBOND ELECTRONICS CORP·Filed 2018·Granted Nov 5, 2019·2 cites·10 claims
- 0957US12474405B2Test device and testing method for memory deviceWINBOND ELECTRONICS CORP·Filed 2024·Granted Nov 18, 2025·0 cites·19 claims
- 1054US9620208B2Devices and methods for programming a resistive random-access memoryWINBOND ELECTRONICS CORP·Filed 2016·Granted Apr 11, 2017·1 cites·10 claims
- 1153US2025216455A1Testing circuit for testing electrical devices and device under testWINBOND ELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1250US7050344B1Failure test method for split gate flash memoryPROMOS TECHNOLOGIES INC·Filed 2004·Granted May 23, 2006·9 cites·19 claims
- 1346US11776636B2Memory array and operation method thereofWINBOND ELECTRONICS CORP·Filed 2022·Granted Oct 3, 2023·0 cites·19 claims
- 1445US2025273264A1Memory array and memory cellWINBOND ELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1544US10978149B1Resistive memory apparatus and adjusting method for write-in voltage thereofWINBOND ELECTRONICS CORP·Filed 2020·Granted Apr 13, 2021·0 cites·17 claims
- 1643US11437101B2Resistive memory storage apparatus and operating method thereofWINBOND ELECTRONICS CORP·Filed 2021·Granted Sep 6, 2022·0 cites·17 claims
- 1741US11289160B2Memory device and data writing methodWINBOND ELECTRONICS CORP·Filed 2020·Granted Mar 29, 2022·0 cites·8 claims
- 1841US10643698B2Operating method of resistive memory storage apparatusWINBOND ELECTRONICS CORP·Filed 2018·Granted May 5, 2020·0 cites·10 claims
- 1941US2010020599A1Multi-level flash memoryPROMOS TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 2041US2010022058A1Method for preparing multi-level flash memoryPROMOS TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 2140US2010019309A1Multi-level flash memory structurePROMOS TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 2240US2010041192A1Method For Preparing Multi-Level Flash Memory StructurePROMOS TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 2336US10818353B1Method for ripening resistive random access memoryWINBOND ELECTRONICS CORP·Filed 2019·Granted Oct 27, 2020·0 cites·17 claims
- 2436US10636507B2Memory-testing methods for testing memory having error-correcting codeWINBOND ELECTRONICS CORP·Filed 2018·Granted Apr 28, 2020·0 cites·14 claims
- 2536US10490275B2Resistive memory storage apparatus and writing method thereof including disturbance voltageWINBOND ELECTRONICS CORP·Filed 2018·Granted Nov 26, 2019·0 cites·18 claims
- 2634US10726890B2Resistive memory apparatus and operating method thereofWINBOND ELECTRONICS CORP·Filed 2018·Granted Jul 28, 2020·0 cites·13 claims
- 2732US9543010B2Resistive memory and measurement system thereofWINBOND ELECTRONICS CORP·Filed 2016·Granted Jan 10, 2017·0 cites·10 claims
- 2826US10783962B2Resistive memory storage apparatus and writing method thereof including disturbance voltageWINBOND ELECTRONICS CORP·Filed 2018·Granted Sep 22, 2020·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →