Inventor · disambiguated record
Lisa Napolitano
Also filed as: NAPOLITANO LISA · NAPOLITANO LISA A · NAPOLITANO LISA ANN
6 granted patents·4 pending applications·96 citations·filing 1998–2017
85Inventor score
Files withNAPOLITANO LISA A2RECKITT BENCKISER INC2THE SUN PRODUCTS CORP2PHILIPS ELECTRONICS NA1PROFESSIONAL DISPOSABLES INT INC1
Top patents by PatentIndex Score
10 records- 0191US9677030B2Aqueous detergent compositionsTHE SUN PRODUCTS CORP·Filed 2015·Granted Jun 13, 2017·10 cites·14 claims
- 0287US9826736B2Quaternary ammonium caprylyl glycol disinfectant wipesNAPOLITANO LISA A·Filed 2010·Granted Nov 28, 2017·23 cites·6 claims
- 0377US7119055B2Hard surface cleaners comprising a thickening gum mixtureRECKITT BENCKISER INC·Filed 2004·Granted Oct 10, 2006·17 cites·22 claims
- 0472US6412326B1Semiconductor calibration structures, semiconductor calibration wafers, calibration methods of calibrating semiconductor wafer coating systems, semiconductor processing methods of ascertaining layer alignment during processing and calibration methods ofPHILIPS ELECTRONICS NA·Filed 1999·Granted Jul 2, 2002·27 cites·5 claims
- 0571US7291586B2Hard surface cleaning compositions comprising suspended alginate inclusionsRECKITT BENCKISER INC·Filed 2004·Granted Nov 6, 2007·12 cites·16 claims
- 0655US2017311592A1Quaternary ammonium caprylyl glycol disinfectant wipesPROFESSIONAL DISPOSABLES INT INC·Filed 2017·Application pending·0 cites
- 0744US6094965ASemiconductor calibration structures and calibration wafers for ascertaining layer alignment during processing and calibrating multiple semiconductor wafer coating systemsVLSI TECHNOLOGY INC·Filed 1998·Granted Aug 1, 2000·7 cites·29 claims
- 0840US2017044471A1Sulfate-Free Liquid Laundry DetergentTHE SUN PRODUCTS CORP·Filed 2016·Application pending·0 cites
- 0939US2012034287A1Quaternary Ammonium Glycol Ether Disinfectant WipesNAPOLITANO LISA A·Filed 2010·Application pending·0 cites
- 1036US2002029608A1Semiconductor calibration structures, semiconductor calibration wafers, calibration methods of calibrating semiconductor wafer coating systems, semiconductor processing methods of ascertaining layer alignment during processing and calibration methods of calibrating multiple semiconductor wafer coating systemsFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →