Inventor · disambiguated record
Liang-Pin Yu
Also filed as: YU LIANG · YU LIANG-PIN
16 granted patents·4 pending applications·18 citations·filing 2006–2024
87Inventor score
Files withTEST RESEARCH INC8HARBIN INST TECHNOLOGY4AU OPTRONICS CORP2BENANO INC2CHENGDU HOMIN TECHNOLOGY CO LTD1
Top patents by PatentIndex Score
20 records- 0185US9019351B2Three-dimensional image measuring apparatusTEST RESEARCH INC·Filed 2012·Granted Apr 28, 2015·9 cites·15 claims
- 0271US9485491B2Optical systemTEST RESEARCH INC·Filed 2014·Granted Nov 1, 2016·2 cites·21 claims
- 0363US9841387B2Inspection method and deviceTEST RESEARCH INC·Filed 2016·Granted Dec 12, 2017·1 cites·14 claims
- 0462US9420235B2Measuring system for a 3D objectWEN KUANG-PU·Filed 2010·Granted Aug 16, 2016·2 cites·16 claims
- 0560US10776588B2Smartphone-based telephone translation systemSHENZHEN ZHIYUAN TECH CO LTD·Filed 2018·Granted Sep 15, 2020·1 cites·9 claims
- 0660US9423246B2Three-dimensional measurement systemTEST RESEARCH INC·Filed 2013·Granted Aug 23, 2016·2 cites·8 claims
- 0759US9686517B2Optical system and image compensating method of optical apparatusTEST RESEARCH INC·Filed 2014·Granted Jun 20, 2017·1 cites·19 claims
- 0856US2023384090A1High-precision dual-axis laser inclinometer based on wavefront homodyne interference and measuring methodHARBIN INST TECHNOLOGY·Filed 2022·Application pending·0 cites
- 0955US12247824B1Heterodyne interferometer based on multi-target opposite displacement measurement and measurement method thereofHARBIN INST TECHNOLOGY·Filed 2024·Granted Mar 11, 2025·0 cites·5 claims
- 1054US12287198B1Heterodyne laser interferometer based on integrated dual polarization beam-splitting assembly and measurement method thereofHARBIN INST TECHNOLOGY·Filed 2024·Granted Apr 29, 2025·0 cites·5 claims
- 1153US8013965B2Liquid crystal display device comprising a passivation layer which forms two inclined planes on opposing sides of grooves formed on a top surface of the lower substrateAU OPTRONICS CORP·Filed 2010·Granted Sep 6, 2011·0 cites·10 claims
- 1252US9885561B2Optical inspection systemTEST RESEARCH INC·Filed 2014·Granted Feb 6, 2018·0 cites·20 claims
- 1350US7817219B2Liquid crystal display device comprising a passivation layer having a depression or cavity at the steps of the source and drain electrodesAU OPTRONICS CORP·Filed 2006·Granted Oct 19, 2010·0 cites·20 claims
- 1445US11733026B2Single-beam three-degree-of-freedom homodyne laser interferometer based on array detectorHARBIN INST TECHNOLOGY·Filed 2022·Granted Aug 22, 2023·0 cites·1 claims
- 1543US11199394B2Apparatus for three-dimensional shape measurementBENANO INC·Filed 2020·Granted Dec 14, 2021·0 cites·10 claims
- 1641US2013278723A1Three-dimensional measurement system and three-dimensional measurement methodTEST RESEARCH INC·Filed 2013·Application pending·0 cites
- 1738US11226198B2Three-dimensional scanning systemBENANO INC·Filed 2018·Granted Jan 18, 2022·0 cites·6 claims
- 1833US2013318202A1Method And Apparatus For Classifying UsersTENCENT TECH SHENZHEN CO LTD·Filed 2013·Application pending·0 cites
- 1931US9423242B2Board-warping measuring apparatus and board-warping measuring method thereofTEST RESEARCH INC·Filed 2015·Granted Aug 23, 2016·0 cites·12 claims
- 2027US2017203925A1Dual-band-material conveying deviceCHENGDU HOMIN TECHNOLOGY CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →