Inventor · disambiguated record

Lothar Bischoff

Also filed as: BISCHOFF LOTHAR

2 granted patents·29 citations·filing 2005–2006

60Inventor score

Technology areasH01J

Files withINTEGRATED CIRCUIT TESTING2

Top patents by PatentIndex Score

2 records

0186US7696489B2Emitter for an ion source and method of producing sameINTEGRATED CIRCUIT TESTING·Filed 2006·Granted Apr 13, 2010·25 cites·24 claims
0270US7335896B2Emitter for an ion sourceINTEGRATED CIRCUIT TESTING·Filed 2005·Granted Feb 26, 2008·4 cites·23 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →