Inventor · disambiguated record
Louis H. Faure
Also filed as: FAURE LOUIS · FAURE LOUIS H · FAURE LOUIS HENRY
12 granted patents·327 citations·filing 1976–2000
93Inventor score
Top patents by PatentIndex Score
12 records- 0185US5367254ATest probe assembly using buckling wire probes within tubes having opposed overlapping slotsIBM·Filed 1993·Granted Nov 22, 1994·60 cites·4 claims
- 0283US5521519ASpring probe with piloted and headed contact and method of tip formationIBM·Filed 1993·Granted May 28, 1996·38 cites·18 claims
- 0382US4805759AInstallation and method for handling delicate objects in an atmosphere having a controlled dust contentEFCIS·Filed 1986·Granted Feb 21, 1989·75 cites·12 claims
- 0477US4554506AModular test probeIBM·Filed 1984·Granted Nov 19, 1985·31 cites·9 claims
- 0575US4052793AMethod of obtaining proper probe alignment in a multiple contact environmentIBM·Filed 1976·Granted Oct 11, 1977·24 cites·6 claims
- 0672US4063172AMultiple site, differential displacement, surface contacting assemblyIBM·Filed 1976·Granted Dec 13, 1977·25 cites·9 claims
- 0768US4227149ASensing probe for determining location of conductive featuresIBM·Filed 1978·Granted Oct 7, 1980·19 cites·7 claims
- 0866US5718040AMethod of making spring probe with piloted and headed contactIBM·Filed 1996·Granted Feb 17, 1998·23 cites·14 claims
- 0961US6299829B1Device for immobilizing an element of a kinematic systemCIE ENGRENAGES ET REDUCTEURS M·Filed 2000·Granted Oct 9, 2001·12 cites·15 claims
- 1055US4066312AHigh density cable connectorIBM·Filed 1976·Granted Jan 3, 1978·15 cites·8 claims
- 1130US5600883AMethod of tip formation for spring probe with piloted and headed contactIBM·Filed 1995·Granted Feb 11, 1997·2 cites·8 claims
- 1227US4161817AMethod and apparatus for making a semiconductor device mounting element embodying an embedded fan-out wire arrangementIBM·Filed 1978·Granted Jul 24, 1979·3 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →