Inventor · disambiguated record
Loc B. Hoang
Also filed as: HOANG LOC · HOANG LOC B · HOANG LOC BAO
43 granted patents·1 pending application·629 citations·filing 1994–2017
98Inventor score
Files withSILICON STORAGE TECH INC22WINBOND ELECTRONICS CORP7WINBOND MEMORY LAB3TRAN HIEU VAN2VAN TRAN HIEU2
Top patents by PatentIndex Score
44 records- 0192US10679685B2Shared bit line array architecture for magnetoresistive memorySPIN MEMORY INC·Filed 2017·Granted Jun 9, 2020·8 cites·20 claims
- 0291US8674749B2Fast start charge pump for voltage regulatorsTRAN HIEU VAN·Filed 2010·Granted Mar 18, 2014·11 cites·9 claims
- 0390US7336516B2Unified multilevel memory systems and methodsSILICON STORAGE TECH INC·Filed 2005·Granted Feb 26, 2008·20 cites·39 claims
- 0489US7868604B2Fast voltage regulators for charge pumpsSILICON STORAGE TECH INC·Filed 2007·Granted Jan 11, 2011·15 cites·26 claims
- 0588US5812452AElectrically byte-selectable and byte-alterable memory arraysWINBOND MEMORY LAB·Filed 1997·Granted Sep 22, 1998·81 cites·17 claims
- 0685US7567458B2Flash memory array having control/decode circuitry for disabling top gates of defective memory cellsSILICON STORAGE TECH INC·Filed 2005·Granted Jul 28, 2009·10 cites·16 claims
- 0784US7737765B2Fast start charge pump for voltage regulatorsSILICON STORAGE TECH INC·Filed 2005·Granted Jun 15, 2010·18 cites·24 claims
- 0884US7447073B2Method for handling a defective top gate of a source-side injection flash memory arraySILICON STORAGE TECH INC·Filed 2007·Granted Nov 4, 2008·9 cites·20 claims
- 0984US6639842B1Method and apparatus for programming non-volatile memory cellsSILICON STORAGE TECH INC·Filed 2002·Granted Oct 28, 2003·37 cites·12 claims
- 1081US7362084B2Fast voltage regulators for charge pumpsSILICON STORAGE TECH INC·Filed 2005·Granted Apr 22, 2008·9 cites·40 claims
- 1181US5986934ASemiconductor memory array with buried drain lines and methods thereforWINBOND ELECTRONICS CORP I·Filed 1997·Granted Nov 16, 1999·56 cites·22 claims
- 1279US7019998B2Unified multilevel cell memorySILICON STORAGE TECH INC·Filed 2003·Granted Mar 28, 2006·20 cites·77 claims
- 1378US7325177B2Test circuit and method for multilevel cell flash memorySILICON STORAGE TECH INC·Filed 2004·Granted Jan 29, 2008·17 cites·11 claims
- 1476US8067931B2Fast voltage regulators for charge pumpsTRAN HIEU VAN·Filed 2011·Granted Nov 29, 2011·3 cites·33 claims
- 1576US6026021ASemiconductor memory array partitioned into memory blocks and sub-blocks and method of addressingWINBOND ELECTRONICS CORP AMERI·Filed 1998·Granted Feb 15, 2000·38 cites·22 claims
- 1675US8270213B2Flash memory array system including a top gate memory cellVAN TRAN HIEU·Filed 2010·Granted Sep 18, 2012·3 cites·30 claims
- 1775US7663921B2Flash memory array with a top gate line dynamically coupled to a word lineSILICON STORAGE TECH INC·Filed 2008·Granted Feb 16, 2010·5 cites·24 claims
- 1875US7626863B2Flash memory array system including a top gate memory cellSILICON STORAGE TECH INC·Filed 2007·Granted Dec 1, 2009·5 cites·20 claims
- 1975US6788595B2Embedded recall apparatus and method in nonvolatile memorySILICON STORAGE TECH INC·Filed 2002·Granted Sep 7, 2004·21 cites·35 claims
- 2075US6687162B1Dual reference cell for split-gate nonvolatile semiconductor memoryWINBOND ELECTRONICS CORP·Filed 2002·Granted Feb 3, 2004·29 cites·20 claims
- 2174US6211547B1Semiconductor memory array with buried drain lines and processing methods thereforWINBOND ELECTRONICS CORP·Filed 1997·Granted Apr 3, 2001·31 cites·6 claims
- 2273US7939892B2Test circuit and method for multilevel cell flash memorySILICON STORAGE TECH INC·Filed 2010·Granted May 10, 2011·3 cites·10 claims
- 2371US8497667B2Fast voltage regulators for charge pumpsVAN TRAN HIEU·Filed 2011·Granted Jul 30, 2013·2 cites·21 claims
- 2469US5365479ARow decoder and driver with switched-bias bulk regionsNAT SEMICONDUCTOR CORP·Filed 1994·Granted Nov 15, 1994·33 cites·18 claims
- 2563US5970022ASemiconductor memory device with reduced read disturbanceWINBOND ELECTRONICS CORP·Filed 1997·Granted Oct 19, 1999·22 cites·16 claims
- 2662US7848140B2Flash memory array system including a top gate memory cellSILICON STORAGE TECH INC·Filed 2009·Granted Dec 7, 2010·2 cites·20 claims
- 2762US7728563B2Fast voltage regulators for charge pumpsSILICON STORAGE TECH INC·Filed 2008·Granted Jun 1, 2010·3 cites·23 claims
- 2861US7778080B2Flash memory array system including a top gate memory cellSILICON STORAGE TECH INC·Filed 2008·Granted Aug 17, 2010·2 cites·35 claims
- 2961US6284601B1Method for fabricating electrically selectable and alterable memory cellsWINBOND MEMORY LAB·Filed 1999·Granted Sep 4, 2001·18 cites·11 claims
- 3059US6456539B1Method and apparatus for sensing a memory signal from a selected memory cell of a memory deviceSILICON STORAGE TECH INC·Filed 2001·Granted Sep 24, 2002·10 cites·12 claims
- 3158US7831872B2Test circuit and method for multilevel cell flash memorySILICON STORAGE TECH INC·Filed 2009·Granted Nov 9, 2010·2 cites·4 claims
- 3257US6876031B1Method and apparatus for split gate source side injection flash memory cell and array with dedicated erase gatesWINBOND ELECTRONICS CORP·Filed 1999·Granted Apr 5, 2005·15 cites·5 claims
- 3356US5903487AMemory device and method of operationWINDBOND ELECTRONICS CORP·Filed 1997·Granted May 11, 1999·16 cites·29 claims
- 3455US7212459B2Unified multilevel cell memorySILICON STORAGE TECH INC·Filed 2005·Granted May 1, 2007·2 cites·7 claims
- 3554US6839277B2User identification for multi-purpose flash memorySILICON STORAGE TECH INC·Filed 2002·Granted Jan 4, 2005·8 cites·14 claims
- 3652US6697281B2Byte-selectable EEPROM array utilizing single split-gate transistor for non-volatile storage cellWINBOND ELECTRONICS CORP·Filed 2001·Granted Feb 24, 2004·7 cites·12 claims
- 3752US5852578AFlash cell having self-timed programmingFiled 1997·Granted Dec 22, 1998·14 cites·11 claims
- 3851US6420753B1Electrically selectable and alterable memory cellsWINBOND MEMORY LAB·Filed 1997·Granted Jul 16, 2002·12 cites·10 claims
- 3944US7661041B2Test circuit and method for multilevel cell flash memorySILICON STORAGE TECH INC·Filed 2007·Granted Feb 9, 2010·0 cites·12 claims
- 4042US6323089B1Semiconductor memory array with buried drain lines and processing methods thereforWINBOND ELECTRONICS CORP AMERI·Filed 1999·Granted Nov 27, 2001·7 cites·13 claims
- 4140US6643174B2EEPROM cells and array with reduced write disturbanceWINBOND ELECTRONICS CORP·Filed 2001·Granted Nov 4, 2003·2 cites·9 claims
- 4236US2002102774A1Method and apparatus for split gate source side injection flash memory cell and array with dedicated erase gatesFiled 2001·Application pending·0 cites
- 4334US6972994B2Circuit and a method to screen for defects in an addressable line in a non-volatile memorySILICON STORAGE TECH INC·Filed 2004·Granted Dec 6, 2005·0 cites·9 claims
- 4434US5708609ASemiconductor memory device with dataline undershoot detection and reduced read access timeWINBOND ELECTRONICS CORP·Filed 1996·Granted Jan 13, 1998·3 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →