Inventor · disambiguated record
Long-Hui Lin
Also filed as: LIN LONG · LIN LONG-HUI
8 granted patents·2 pending applications·48 citations·filing 2003–2020
84Inventor score
Top patents by PatentIndex Score
10 records- 0166US6825119B1Method of piping defect detectionPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Nov 30, 2004·12 cites·17 claims
- 0262US7071011B2Method of defect reviewPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Jul 4, 2006·9 cites·9 claims
- 0360US7193698B2Wafer defect detection methods and systemsPOWERCHIP SEMICONDUCTOR CORP·Filed 2005·Granted Mar 20, 2007·3 cites·9 claims
- 0458US7132354B2Inspection methods for a semiconductor devicePOWERCHIP SEMICONDUCTOR CORP·Filed 2005·Granted Nov 7, 2006·2 cites·18 claims
- 0556US6807454B2Method for automatically controlling defect -specification in a semiconductor manufacturing processPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Oct 19, 2004·6 cites·10 claims
- 0655US7382451B2Method of defect inspectionPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Jun 3, 2008·6 cites·6 claims
- 0746US7020536B2Method of building a defect databasePOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Mar 28, 2006·10 cites·8 claims
- 0838US12231565B2Login authentication method, apparatus, and systemHUAWEI TECH CO LTD·Filed 2020·Granted Feb 18, 2025·0 cites·11 claims
- 0937US2005080572A1Method of defect controlFiled 2004·Application pending·0 cites
- 1035US2005049836A1Method of defect root cause analysisFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →