Inventor · disambiguated record
Luciano Mule′Stagno
Also filed as: MULE STAGNO LUCIANO
2 granted patents·31 citations·filing 2000–2001
62Inventor score
Files withMEMC ELECTRONIC MATERIALS2
Top patents by PatentIndex Score
2 records- 0183US6391662B1Process for detecting agglomerated intrinsic point defects by metal decorationMEMC ELECTRONIC MATERIALS·Filed 2000·Granted May 21, 2002·22 cites·30 claims
- 0266US6565649B2Epitaxial wafer substantially free of grown-in defectsMEMC ELECTRONIC MATERIALS·Filed 2001·Granted May 20, 2003·9 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →