Inventor · disambiguated record
Lyudmila Zaykova-Feldman
Also filed as: ZAYKOVA-FELDMAN LYUDMILA
10 granted patents·3 pending applications·91 citations·filing 2005–2014
88Inventor score
Top patents by PatentIndex Score
13 records- 0195US7414252B2Method and apparatus for the automated process of in-situ lift-outOMNIPROBE INC·Filed 2005·Granted Aug 19, 2008·34 cites·65 claims
- 0293US8227781B2Variable-tilt specimen holder and method and for monitoring milling in a charged-particle instrumentZAYKOVA-FELDMAN LYUDMILA·Filed 2010·Granted Jul 24, 2012·25 cites·8 claims
- 0387US7834315B2Method for STEM sample inspection in a charged particle beam instrumentOMNIPROBE INC·Filed 2008·Granted Nov 16, 2010·8 cites·12 claims
- 0486US8247768B2Method for stem sample inspection in a charged particle beam instrumentZAYKOVA-FELDMAN LYUDMILA·Filed 2010·Granted Aug 21, 2012·6 cites·8 claims
- 0583US7208724B2Apparatus and method of detecting probe tip contact with a surfaceOMNIPROBE INC·Filed 2005·Granted Apr 24, 2007·8 cites·18 claims
- 0679US7935937B2Method of forming TEM sample holderOMNIPROBE IN C·Filed 2009·Granted May 3, 2011·7 cites·30 claims
- 0769US8168949B2Method for stem sample inspection in a charged particle beam instrumentZAYKOVA-FELDMAN LYUDMILA·Filed 2010·Granted May 1, 2012·1 cites·5 claims
- 0867US7446542B2Apparatus and method for automated stress testing of flip-chip packagesOMNIPROBE INC·Filed 2006·Granted Nov 4, 2008·2 cites·7 claims
- 0964USRE46350EMethod for stem sample inspection in a charged particle beam instrumentOMNIPROBE INC·Filed 2014·Granted Mar 28, 2017·0 cites·10 claims
- 1056US7755372B2Method for automated stress testing of flip-chip packagesOMNIPROBE INC·Filed 2008·Granted Jul 13, 2010·0 cites·10 claims
- 1156US2010068408A1Methods for electron-beam induced deposition of material inside energetic-beam microscopesOMNIPROBE INC·Filed 2008·Application pending·0 cites
- 1252US2006219919A1TEM sample holder and method of forming sameMOORE THOMAS M·Filed 2006·Application pending·0 cites
- 1345US2010200546A1Method of etching materials with electron beam and laser energyOMNIPROBE INC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →