Inventor · disambiguated record
M. Lawrence A. Dass
Also filed as: DASS M LAWRENCE A
9 granted patents·468 citations·filing 1994–2002
91Inventor score
Files withINTEL CORP9
Top patents by PatentIndex Score
9 records- 0193US6162652AProcess for sort testing C4 bumped wafersINTEL CORP·Filed 1997·Granted Dec 19, 2000·177 cites·16 claims
- 0283US6891592B2Wafer level electro-optical sort testing and wafer level assembly of micro liquid crystal-on silicon (LCOS) devicesINTEL CORP·Filed 2002·Granted May 10, 2005·30 cites·27 claims
- 0383US6352940B1Semiconductor passivation deposition process for interfacial adhesionINTEL CORP·Filed 1998·Granted Mar 5, 2002·65 cites·22 claims
- 0477US6046101APassivation technology combining improved adhesion in passivation and a scribe street without passivationINTEL CORP·Filed 1997·Granted Apr 4, 2000·57 cites·2 claims
- 0576US6515358B1Integrated passivation process, probe geometry and probing processINTEL CORP·Filed 2000·Granted Feb 4, 2003·34 cites·17 claims
- 0674US5536684AProcess for formation of epitaxial cobalt silicide and shallow junction of siliconINTEL CORP·Filed 1994·Granted Jul 16, 1996·56 cites·36 claims
- 0767US6357330B1Method and apparatus for cutting a waferINTEL CORP·Filed 1999·Granted Mar 19, 2002·27 cites·12 claims
- 0855US7202568B2Semiconductor passivation deposition process for interfacial adhesionINTEL CORP·Filed 2001·Granted Apr 10, 2007·4 cites·10 claims
- 0955US6143668AKLXX technology with integrated passivation process, probe geometry and probing processINTEL CORP·Filed 1997·Granted Nov 7, 2000·18 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →