Inventor · disambiguated record
M. Brandon Steele
Also filed as: STEELE M BRANDON
12 granted patents·94 citations·filing 2003–2014
91Inventor score
Top patents by PatentIndex Score
12 records- 0192US7107158B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2005·Granted Sep 12, 2006·18 cites·35 claims
- 0291US7634365B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2008·Granted Dec 15, 2009·16 cites·33 claims
- 0381US7337076B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2006·Granted Feb 26, 2008·6 cites·20 claims
- 0480US7092826B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2005·Granted Aug 15, 2006·6 cites·28 claims
- 0577US7659734B2Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illuminationQCEPT TECHNOLOGIES INC·Filed 2007·Granted Feb 9, 2010·7 cites·29 claims
- 0674US6957154B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2003·Granted Oct 18, 2005·14 cites·18 claims
- 0773US7379826B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2006·Granted May 27, 2008·3 cites·20 claims
- 0871US7103482B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2004·Granted Sep 5, 2006·10 cites·24 claims
- 0966US7308367B2Wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2004·Granted Dec 11, 2007·7 cites·44 claims
- 1063US7900526B2Defect classification utilizing data from a non-vibrating contact potential difference sensorQCEPT TECHNOLOGIES INC·Filed 2007·Granted Mar 8, 2011·2 cites·21 claims
- 1158US7152476B2Measurement of motions of rotating shafts using non-vibrating contact potential difference sensorQCEPT TECHNOLOGIES INC·Filed 2004·Granted Dec 26, 2006·5 cites·19 claims
- 1240US9625557B2Work function calibration of a non-contact voltage sensorSTEELE M BRANDON·Filed 2014·Granted Apr 18, 2017·0 cites·10 claims
Join the waitlist — get patent alerts
Get an alert when M. Brandon Steele files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →