Inventor · disambiguated record
Makoto Abbe
Also filed as: ABBE MAKOTO
10 granted patents·107 citations·filing 2002–2010
88Inventor score
Top patents by PatentIndex Score
10 records- 0183US6748790B2Method of calibrating measuring machinesMITUTOYO CORP·Filed 2002·Granted Jun 15, 2004·45 cites·5 claims
- 0277US6640607B2Method and apparatus for calibrating measuring machinesMITUTOYO CORP·Filed 2002·Granted Nov 4, 2003·33 cites·13 claims
- 0370US7225104B2Method and program for estimating uncertaintyMITUTOYO CORP·Filed 2006·Granted May 29, 2007·7 cites·8 claims
- 0469US7765079B2Two-dimensional lattice calibrating device, two-dimensional lattice calibrating method, two-dimensional lattice calibrating program and recording mediumMITUTOYO CORP·Filed 2008·Granted Jul 27, 2010·6 cites·11 claims
- 0564US7538888B2Method for estimating absolute distance of tracking laser interferometer and tracking laser interferometerMITUTOYO CORP·Filed 2007·Granted May 26, 2009·6 cites·5 claims
- 0659US7408650B2Optical-axis deflection type laser interferometer, calibration method thereof, correcting method thereof, and measuring method thereofMITUTOYO CORP·Filed 2007·Granted Aug 5, 2008·5 cites·10 claims
- 0758US8306787B2Method of evaluating precision of output data using error propagationTAKAMASU KIYOSHI·Filed 2010·Granted Nov 6, 2012·2 cites·5 claims
- 0847US7599070B2Optical axis polarization type laser interferometerMITUTOYO CORP·Filed 2008·Granted Oct 6, 2009·1 cites·7 claims
- 0947US7188046B2Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the programMITUTOYO CORP·Filed 2004·Granted Mar 6, 2007·2 cites·9 claims
- 1046US7483807B2Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the programMITUTOYO CORP·Filed 2007·Granted Jan 27, 2009·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →