Inventor · disambiguated record
Markus Brandner
Also filed as: BRANDNER MARKUS
3 granted patents·7 citations·filing 2008–2018
58Inventor score
Top patents by PatentIndex Score
3 records- 0180US10488434B2Characterizing a height profile of a sample by side view imagingANTON PAAR GMBH·Filed 2018·Granted Nov 26, 2019·3 cites·13 claims
- 0260US8368393B2Measurement method, sensor arrangement and measurement systemAUSTRIAMICROSYSTEMS AG·Filed 2008·Granted Feb 5, 2013·4 cites·20 claims
- 0340US10684307B2Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side viewANTON PAAR GMBH·Filed 2017·Granted Jun 16, 2020·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →