Inventor · disambiguated record
Mao-Nan Chang
Also filed as: CHANG MAO-NAN
6 granted patents·4 pending applications·30 citations·filing 2004–2024
75Inventor score
Files withNAT APPLIED RES LABORATORIES5MSSCORPS CO LTD2IND TECH RES INST1NAT APPLIED RES LABRATORIES1RES LAB INSTR TECHNOLOGY RES CT NAT APPLIED1
Top patents by PatentIndex Score
10 records- 0182US7193424B2Electrical scanning probe microscope apparatusNAT APPLIED RES LABORATORIES·Filed 2005·Granted Mar 20, 2007·11 cites·7 claims
- 0265US6975129B2Electrical scanning probe microscope apparatusNAT APPLIED RES LABRATORIES·Filed 2004·Granted Dec 13, 2005·18 cites·4 claims
- 0352US2025341555A1Method for obtaining the dielectric constant of a dielectric sheetMSSCORPS CO LTD·Filed 2024·Application pending·0 cites
- 0450US9861975B2Visible light response catalyst structure and process for manufacturing the sameNAT APPLIED RES LABORATORIES·Filed 2014·Granted Jan 9, 2018·0 cites·8 claims
- 0548US2024230710A9Method for obtaining the equivalent oxide thickness of a dielectric layerMSSCORPS CO LTD·Filed 2023·Application pending·0 cites
- 0647US2023207386A1Method of increasing resistivity of silicon carbide wafer and high-frequency device and method of manufacturing the sameIND TECH RES INST·Filed 2022·Application pending·0 cites
- 0746US7210340B2Front-wing cantilever for the conductive probe of electrical scanning probe microscopesNAT APPLIED RES LABORATORIES·Filed 2005·Granted May 1, 2007·1 cites·5 claims
- 0842US10026620B1Method of irradiating ultraviolet light on silicon substrate surface for improving quality of native oxide layer and apparatus using the sameNAT APPLIED RES LABORATORIES·Filed 2017·Granted Jul 17, 2018·0 cites·6 claims
- 0941US2014193585A1Method for Modifying Probe TipRES LAB INSTR TECHNOLOGY RES CT NAT APPLIED·Filed 2013·Application pending·0 cites
- 1040US9255944B1Tip structure of platinum-platinum silicide-silicon composite field sensor probe and method for forming MSTA strucutre on the probeNAT APPLIED RES LABORATORIES·Filed 2015·Granted Feb 9, 2016·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →