Inventor · disambiguated record
Mark Van Dal
Also filed as: DAL MARK VAN
6 granted patents·15 citations·filing 2012–2018
75Inventor score
Top patents by PatentIndex Score
6 records- 0191US9368604B1Method of removing threading dislocation defect from a fin feature of III-V group semiconductor materialTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Jun 14, 2016·9 cites·20 claims
- 0282US10121858B2Elongated semiconductor structure planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Nov 6, 2018·3 cites·17 claims
- 0379US9806176B2Structure and method for defect passivation to reduce junction leakage for finfet deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 31, 2017·3 cites·20 claims
- 0459US10861933B2Elongated semiconductor structure planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 8, 2020·0 cites·20 claims
- 0550US9384991B2Carbon layer and method of manufactureTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Jul 5, 2016·0 cites·20 claims
- 0637US9680027B2Nickelide source/drain structures for CMOS transistorsOXLAND RICHARD KENNETH·Filed 2012·Granted Jun 13, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →