Inventor · disambiguated record
Martin Eckert
Also filed as: ECKERT MARTIN
57 granted patents·10 pending applications·322 citations·filing 2001–2023
98Inventor score
Top patents by PatentIndex Score
67 records- 0196US10082526B1Probe card alignmentIBM·Filed 2017·Granted Sep 25, 2018·8 cites·1 claims
- 0294US10082419B1Adjustable load transmitterIBM·Filed 2017·Granted Sep 25, 2018·8 cites·1 claims
- 0389US10345136B2Adjustable load transmitterIBM·Filed 2017·Granted Jul 9, 2019·4 cites·7 claims
- 0489US7559692B2X-ray sensitive camera comprising two image receivers and X-ray deviceSIRONA DENTAL SYSTEMS GMBH·Filed 2007·Granted Jul 14, 2009·60 cites·7 claims
- 0588US9977053B2Wafer probe alignmentIBM·Filed 2016·Granted May 22, 2018·4 cites·10 claims
- 0687US8535956B2Chip attach frameECKERT MARTIN·Filed 2012·Granted Sep 17, 2013·7 cites·6 claims
- 0787US7949517B2Dialogue system with logical evaluation for language identification in speech recognitionDEUTSCHE TELEKOM AG·Filed 2007·Granted May 24, 2011·30 cites·28 claims
- 0886US9740813B1Layout effect characterization for integrated circuitsIBM·Filed 2016·Granted Aug 22, 2017·4 cites·15 claims
- 0986US9401222B1Determining categories for memory fail conditionsIBM·Filed 2015·Granted Jul 26, 2016·9 cites·20 claims
- 1084US9804231B2Power noise histogram of a computer systemGLOBALFOUNDRIES INC·Filed 2014·Granted Oct 31, 2017·7 cites·17 claims
- 1183US10146144B1Adjustable load transmitterIBM·Filed 2017·Granted Dec 4, 2018·5 cites·12 claims
- 1282US11262381B2Device for positioning a semiconductor die in a wafer proberIBM·Filed 2020·Granted Mar 1, 2022·2 cites·18 claims
- 1382US6695747B2Transmission mechanism comprising a shifting deviceLUK LAMELLEN & KUPPLUNGSBAU·Filed 2001·Granted Feb 24, 2004·17 cites·17 claims
- 1481US10527649B2Probe card alignmentIBM·Filed 2017·Granted Jan 7, 2020·1 cites·4 claims
- 1581US9885748B2Module testing utilizing wafer probe test equipmentIBM·Filed 2015·Granted Feb 6, 2018·2 cites·18 claims
- 1680US10422817B2Probe card alignmentIBM·Filed 2017·Granted Sep 24, 2019·1 cites·15 claims
- 1779US9927463B2Wafer probe alignmentIBM·Filed 2015·Granted Mar 27, 2018·2 cites·10 claims
- 1878US10605649B2Adjustable load transmitterIBM·Filed 2019·Granted Mar 31, 2020·1 cites·20 claims
- 1977US9892789B1Content addressable memory with match hit quality indicationIBM·Filed 2017·Granted Feb 13, 2018·3 cites·19 claims
- 2077US9496188B2Soldering three dimensional integrated circuitsIBM·Filed 2015·Granted Nov 15, 2016·3 cites·19 claims
- 2177US7322746B2X-ray sensitive camera comprising two image receivers and X-ray deviceSIRONA DENTAL SYSTEMS GMBH·Filed 2004·Granted Jan 29, 2008·79 cites·3 claims
- 2273US8126703B2Method, spoken dialog system, and telecommunications terminal device for multilingual speech outputRUNGE FRED·Filed 2007·Granted Feb 28, 2012·6 cites·19 claims
- 2370US8659310B2Method and system for performing self-tests in an electronic systemECKERT MARTIN·Filed 2011·Granted Feb 25, 2014·2 cites·20 claims
- 2469US10955440B2Probe card alignmentIBM·Filed 2019·Granted Mar 23, 2021·0 cites·20 claims
- 2568US6997075B2Motor vehicle with a gearbox and method for operating a motor vehicleLUK LAMELLEN & KUPPLUNGSBAU·Filed 2003·Granted Feb 14, 2006·13 cites·25 claims
- 2667US7466716B2Reducing latency in a channel adapter by accelerated I/O control block processingIBM·Filed 2005·Granted Dec 16, 2008·4 cites·21 claims
- 2764US7747428B1Visibly distinguishing portions of compound wordsYAHOO INC·Filed 2003·Granted Jun 29, 2010·11 cites·12 claims
- 2862US8866504B2Determining local voltage in an electronic systemECKERT MARTIN·Filed 2011·Granted Oct 21, 2014·1 cites·14 claims
- 2960US9183833B2Method and system for adapting interactionsRUNGE FRED·Filed 2007·Granted Nov 10, 2015·5 cites·24 claims
- 3060US6341093B1SOI array sense and write margin qualificationIBM·Filed 2001·Granted Jan 22, 2002·11 cites·13 claims
- 3159US8180142B2Test fail analysis on VLSI chipsECKERT MARTIN·Filed 2008·Granted May 15, 2012·2 cites·25 claims
- 3258US10114914B2Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Oct 30, 2018·0 cites·15 claims
- 3358US9904748B1Layout effect characterization for integrated circuitsIBM·Filed 2017·Granted Feb 27, 2018·0 cites·14 claims
- 3457US10056346B2Chip attach frameIBM·Filed 2017·Granted Aug 21, 2018·0 cites·5 claims
- 3557US8253552B2Method and device for configuring functional capabilities in a data processing systemAXNIX CHRISTINE·Filed 2009·Granted Aug 28, 2012·1 cites·20 claims
- 3656US9891272B2Module testing utilizing wafer probe test equipmentIBM·Filed 2015·Granted Feb 13, 2018·0 cites·9 claims
- 3756US9709625B2Measuring power consumption in an integrated circuitECKERT MARTIN·Filed 2011·Granted Jul 18, 2017·1 cites·10 claims
- 3856US9686895B2Chip attach frameIBM·Filed 2013·Granted Jun 20, 2017·0 cites·6 claims
- 3954US11209479B2Stressing integrated circuits using a radiation sourceIBM·Filed 2019·Granted Dec 28, 2021·0 cites·20 claims
- 4054US7188541B2Transmission mechanism comprising a shifting deviceLUK LAMELLEN & KUPPLUNGSBAU·Filed 2006·Granted Mar 13, 2007·1 cites·58 claims
- 4154US7051609B2Transmission mechanism comprising a shifting deviceLUK LAMELLEN & KUPPLUNGSBAU·Filed 2003·Granted May 30, 2006·4 cites·14 claims
- 4253US10614884B2Content addressable memory with match hit quality indicationIBM·Filed 2019·Granted Apr 7, 2020·0 cites·6 claims
- 4352US9250289B2System for electrical testing and manufacturing of a 3-D chip stack and methodIBM·Filed 2013·Granted Feb 2, 2016·0 cites·13 claims
- 4451US2024338744A1Computerized systems and methods for location-based content filtering and deliveryYAHOO ASSETS LLC·Filed 2023·Application pending·0 cites
- 4549US10347337B2Content addressable memory with match hit quality indicationIBM·Filed 2017·Granted Jul 9, 2019·0 cites·18 claims
- 4649US9679665B2Method for performing built-in self-testsIBM·Filed 2014·Granted Jun 13, 2017·0 cites·15 claims
- 4748US2013153250A1ToolBOSCH GMBH ROBERT·Filed 2012·Application pending·0 cites
- 4848US2022146014A1Valve drive device, a method for operating a valve drive device, and a process deviceFESTO SE & CO KG·Filed 2021·Application pending·0 cites
- 4947US11239152B2Integrated circuit with optical tunnelIBM·Filed 2019·Granted Feb 1, 2022·0 cites·11 claims
- 5047US10114069B2Method for electrical testing of a 3-D chip stackIBM·Filed 2015·Granted Oct 30, 2018·0 cites·4 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →