Inventor · disambiguated record
Mark Eyolfson
Also filed as: EYOLFSON MARK
7 granted patents·1 pending application·70 citations·filing 1997–2006
86Inventor score
Files withMICRON TECHNOLOGY INC8
Top patents by PatentIndex Score
8 records- 0174US6369887B2Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed lightMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 9, 2002·9 cites·17 claims
- 0267US6287927B1Methods of thermal processing and rapid thermal processingMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 11, 2001·11 cites·26 claims
- 0361US7102737B2Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed lightMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 5, 2006·4 cites·59 claims
- 0458US6090677AMethods of thermal processing and rapid thermal processingMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 18, 2000·21 cites·17 claims
- 0557US6256094B1Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed lightMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 3, 2001·15 cites·14 claims
- 0651US7319935B2System and method for analyzing electrical failure dataMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 15, 2008·7 cites·66 claims
- 0740US2006265156A1System and method for analyzing electrical failure dataMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 0834US6704107B1Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed lightMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 9, 2004·3 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →