Inventor · disambiguated record
Marc Fouchier
Also filed as: FOUCHIER MARC
4 granted patents·1 pending application·12 citations·filing 2004–2021
68Inventor score
Top patents by PatentIndex Score
5 records- 0175US7500387B2Dual tip atomic force microscopy probe and method for producing such a probeIMEC INTER UNI MICRO ELECTR·Filed 2006·Granted Mar 10, 2009·7 cites·9 claims
- 0252US11782001B2Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurementsAttolight AG·Filed 2021·Granted Oct 10, 2023·0 cites·20 claims
- 0347US2008230856A1Intermediate probe structures for atomic force microscopyIMEC INTER UNI MICRO ELECTR·Filed 2007·Application pending·0 cites
- 0444US7240428B2Method for making probes for atomic force microscopyIMEC INTER UNI MICRO ELECTR·Filed 2004·Granted Jul 10, 2007·4 cites·11 claims
- 0542US8079093B2Dual tip atomic force microscopy probe and method for producing such a probeFOUCHIER MARC·Filed 2009·Granted Dec 13, 2011·1 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →