Inventor · disambiguated record
Masashi Fujita
Also filed as: FUJITA MASASHI
63 granted patents·20 pending applications·268 citations·filing 1993–2025
98Inventor score
Files withSEMICONDUCTOR ENERGY LAB32HITACHI HIGH TECH CORP15FUJITA MASASHI12HONDA MOTOR CO LTD4ORGANO CORP3
Top patents by PatentIndex Score
83 records- 0194US7900896B2Specimen stageHITACHI HIGH TECH CORP·Filed 2009·Granted Mar 8, 2011·22 cites·7 claims
- 0289US8792260B2Rectifier circuit and semiconductor device using the sameFUJITA MASASHI·Filed 2011·Granted Jul 29, 2014·11 cites·11 claims
- 0389US7929332B2Semiconductor memory device and semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Apr 19, 2011·14 cites·15 claims
- 0487US7443717B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted Oct 28, 2008·12 cites·16 claims
- 0586US8787083B2Memory circuitFUJITA MASASHI·Filed 2012·Granted Jul 22, 2014·7 cites·21 claims
- 0685US9064599B2Memory circuitSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jun 23, 2015·6 cites·17 claims
- 0785US6523966B1LCD display with multi-color illumination meansMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Feb 25, 2003·34 cites·30 claims
- 0883US8937304B2Semiconductor device and electronic deviceFUJITA MASASHI·Filed 2012·Granted Jan 20, 2015·6 cites·6 claims
- 0983US8760903B2Storage circuitFUJITA MASASHI·Filed 2012·Granted Jun 24, 2014·7 cites·17 claims
- 1083US8705292B2Nonvolatile memory circuit with an oxide semiconductor transistor for reducing power consumption and electronic deviceFUJITA MASASHI·Filed 2012·Granted Apr 22, 2014·7 cites·15 claims
- 1182US10559667B2Semiconductor device and method for measuring current of semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Feb 11, 2020·2 cites·13 claims
- 1281US9490267B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Nov 8, 2016·3 cites·20 claims
- 1381US9115707B2Inverter module and integrated-inverter electric compressor using the sameHATTORI MAKOTO·Filed 2010·Granted Aug 25, 2015·8 cites·7 claims
- 1480US12283954B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2023·Granted Apr 22, 2025·0 cites·15 claims
- 1580US8681533B2Memory circuit, signal processing circuit, and electronic deviceFUJITA MASASHI·Filed 2012·Granted Mar 25, 2014·7 cites·7 claims
- 1679US11908947B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2020·Granted Feb 20, 2024·1 cites·15 claims
- 1779US10460683B2Semiconductor device, display device, and electronic deviceSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted Oct 29, 2019·1 cites·9 claims
- 1879US9601307B2Charged particle radiation apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Mar 21, 2017·4 cites·5 claims
- 1979US8878706B2Serial-parallel conversion circuit, method for driving the same, display device, and semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Nov 4, 2014·3 cites·18 claims
- 2079US2025150083A1Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2025·Application pending·0 cites
- 2178US8259487B2Semiconductor memory device and semiconductor deviceFUJITA MASASHI·Filed 2011·Granted Sep 4, 2012·4 cites·19 claims
- 2278US6995370B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Feb 7, 2006·12 cites·8 claims
- 2376US8164933B2Power source circuitFUJITA MASASHI·Filed 2008·Granted Apr 24, 2012·7 cites·21 claims
- 2475US8328105B2Semiconductor deviceFUJITA MASASHI·Filed 2010·Granted Dec 11, 2012·4 cites·8 claims
- 2574US11750194B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2021·Granted Sep 5, 2023·0 cites·14 claims
- 2674US8174229B2Sample stage apparatus and method of controlling the sameFUJITA MASASHI·Filed 2009·Granted May 8, 2012·3 cites·17 claims
- 2773US6833199B2Joined structure of different metal materialsHONDA MOTOR CO LTD·Filed 2002·Granted Dec 21, 2004·11 cites·16 claims
- 2872US10290573B2Semiconductor device and electronic deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted May 14, 2019·2 cites·20 claims
- 2972US9543113B2Charged-particle beam device for irradiating a charged particle beam on a sampleHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 10, 2017·2 cites·6 claims
- 3072US7901521B2Aluminum base alloyHONDA MOTOR CO LTD·Filed 2008·Granted Mar 8, 2011·1 cites·5 claims
- 3171US7375329B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted May 20, 2008·2 cites·10 claims
- 3270US9355687B2Storage circuitSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted May 31, 2016·3 cites·9 claims
- 3370US9105446B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 11, 2015·2 cites·5 claims
- 3470US7782657B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Aug 24, 2010·3 cites·8 claims
- 3568US10897258B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2019·Granted Jan 19, 2021·0 cites·12 claims
- 3667US7541719B2Stage and X-Y stage each on which to place sample, and charged-particle beam apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 2, 2009·4 cites·9 claims
- 3766US9647132B2Semiconductor device and memory deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted May 9, 2017·1 cites·16 claims
- 3865US9762246B2Semiconductor device with a storage circuit having an oxide semiconductorFUJITA MASASHI·Filed 2012·Granted Sep 12, 2017·1 cites·15 claims
- 3965US2025299902A1Sample inspection systemHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 4062US12504632B2Optical deviceSEMICONDUCTOR ENERGY LAB·Filed 2022·Granted Dec 23, 2025·0 cites·9 claims
- 4161US9972389B2Method for operating semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted May 15, 2018·1 cites·12 claims
- 4261US8409890B2Semiconductor device and manufacturing method thereofTADOKORO ASAMI·Filed 2009·Granted Apr 2, 2013·2 cites·7 claims
- 4361US6739388B2Air-conditioning system for a vehicleMITSUBISHI HEAVY IND LTD·Filed 2002·Granted May 25, 2004·9 cites·2 claims
- 4461US2024404780A1Semiconductor processing apparatusHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 4560US8345401B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2009·Granted Jan 1, 2013·3 cites·16 claims
- 4660US2024379385A1Wafer conveyance deviceHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 4759US11600705B2Semiconductor device and method for measuring current of semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2020·Granted Mar 7, 2023·0 cites·10 claims
- 4859US8817527B2Semiconductor deviceKOBAYASHI HIDETOMO·Filed 2012·Granted Aug 26, 2014·2 cites·18 claims
- 4958US9633710B2Method for operating semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Apr 25, 2017·1 cites·16 claims
- 5057US7528327B2Inspection method and semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted May 5, 2009·2 cites·24 claims
Showing the top 50 of 83 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →