Inventor · disambiguated record
Mark Geshel
Also filed as: GESHEL MARK
8 granted patents·2 pending applications·55 citations·filing 2002–2024
83Inventor score
Top patents by PatentIndex Score
10 records- 0197US11462300B2Methods and systems for sequence callingULTIMA GENOMICS INC·Filed 2021·Granted Oct 4, 2022·10 cites·20 claims
- 0286US10161882B1Method of examining locations in a wafer with adjustable navigation accuracy and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 25, 2018·4 cites·20 claims
- 0386US8640060B2Method of generating a recipe for a manufacturing tool and system thereofGESHEL MARK·Filed 2012·Granted Jan 28, 2014·7 cites·16 claims
- 0477US7155052B2Method for pattern inspectionTOKYO SEIMITSU ISRAEL LTD·Filed 2002·Granted Dec 26, 2006·32 cites·27 claims
- 0574US2023197197A1Methods and systems for sequence callingULTIMA GENOMICS INC·Filed 2022·Application pending·0 cites
- 0667US10663407B2Method of examining locations in a wafer with adjustable navigation accuracy and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted May 26, 2020·0 cites·20 claims
- 0765US2024274237A1Barcode selectionULTIMA GENOMICS INC·Filed 2024·Application pending·0 cites
- 0863US10290087B2Method of generating an examination recipe and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 14, 2019·1 cites·20 claims
- 0960US9141730B2Method of generating a recipe for a manufacturing tool and system thereofGESHEL MARK·Filed 2011·Granted Sep 22, 2015·1 cites·20 claims
- 1042US9401013B2Method of design-based defect classification and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Jul 26, 2016·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →