Inventor · disambiguated record
Matthew R. Harrington
Also filed as: HARRINGTON MATTHEW · HARRINGTON MATTHEW R · HARRINGTON MATTHEW RAY
11 granted patents·1 pending application·109 citations·filing 1998–2022
90Inventor score
Files withMICRON TECHNOLOGY INC5MAXIM INTEGRATED PRODUCTS3TEXAS INSTRUMENTS INC2MAX PLANCK GESELLSCHAFT1PEAK JR MARVIN LYLE1
Top patents by PatentIndex Score
12 records- 0182US6418070B1Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 9, 2002·36 cites·22 claims
- 0278US8698358B1Active parasite power circuitMAXIM INTEGRATED PRODUCTS·Filed 2012·Granted Apr 15, 2014·5 cites·3 claims
- 0366US9660638B1One wire parasite power switch control circuitMAXIM INTEGRATED PRODUCTS·Filed 2015·Granted May 23, 2017·2 cites·19 claims
- 0466US6775192B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 10, 2004·10 cites·36 claims
- 0566US6674677B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 6, 2004·10 cites·30 claims
- 0663US6134168ACircuit and method for internal refresh counterTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 17, 2000·22 cites·8 claims
- 0761US2024123112A1Self-supporting viscin films and scaffolds, uses thereof and methods for preparing the sameMAX PLANCK GESELLSCHAFT·Filed 2022·Application pending·0 cites
- 0859US5999473ACircuit and method for internal refresh counterTEXAS INSTRUMENTS INC·Filed 1998·Granted Dec 7, 1999·19 cites·7 claims
- 0957US7161866B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 9, 2007·2 cites·35 claims
- 1051US9106138B1Active parasite power circuitMAXIM INTEGRATED PRODUCTS·Filed 2014·Granted Aug 11, 2015·0 cites·5 claims
- 1146US8278782B2Active parasite power circuitPEAK JR MARVIN LYLE·Filed 2009·Granted Oct 2, 2012·1 cites·9 claims
- 1243US6914843B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 5, 2005·2 cites·33 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →