Inventor · disambiguated record
Masakazu Hisatsune
Also filed as: HISATSUNE MASAKAZU
9 granted patents·2 pending applications·68 citations·filing 2000–2010
87Inventor score
Top patents by PatentIndex Score
11 records- 0190US7035777B2Method of offering wall-thickness thinning prediction information, and computer-readable recording medium storing wall-thickness thinning prediction program, and method of planning piping work planHITACHI LTD·Filed 2001·Granted Apr 25, 2006·22 cites·5 claims
- 0288US7398193B2Method of offering wall-thickness thinning prediction information, and computer-readable recording medium storing wall-thickness thinning prediction program, and method of planning piping work planHITACHI GE NUCLEAR ENERGY LTD·Filed 2006·Granted Jul 8, 2008·12 cites·1 claims
- 0373US7089165B2Method of offering wall-thickness thinning prediction information, and computer-readable recording medium storing wall-thickness thinning prediction program, and method of planning piping work planHITACHI LTD·Filed 2005·Granted Aug 8, 2006·5 cites·7 claims
- 0471US6487518B1Thickness reducing management system for pipes in pipe linesHITACHI LTD·Filed 2000·Granted Nov 26, 2002·21 cites·20 claims
- 0559US7565812B2Method for improving residual stress in pipe and apparatusHITACHI GE NUCLEAR ENERGY LTD·Filed 2006·Granted Jul 28, 2009·1 cites·4 claims
- 0656US7866166B2Method for improving residual stress in pipe and apparatusHITACHI GE NUCLEAR ENERGY LTD·Filed 2009·Granted Jan 11, 2011·0 cites·15 claims
- 0756US6434207B1Inspection method and apparatus for pipingHITACHI LTD·Filed 2000·Granted Aug 13, 2002·3 cites·4 claims
- 0850US6665364B2Inspection method and apparatus for pipingHITACHI LTD·Filed 2002·Granted Dec 16, 2003·2 cites·5 claims
- 0946US2011073219A1Method for improving residual stress in pipe and apparatusAOIKE SATORU·Filed 2010·Application pending·0 cites
- 1044US6972759B2Image matching deviceHITACHI LTD·Filed 2002·Granted Dec 6, 2005·2 cites·4 claims
- 1135US2003011591A1Image matching deviceFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →