Inventor · disambiguated record
Masahiro Horie
Also filed as: HORIE MASAHIRO
20 granted patents·10 pending applications·472 citations·filing 1991–2022
96Inventor score
Files withDAINIPPON SCREEN MFG17MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4PANASONIC CORP2SAMSUNG ELECTRONICS CO LTD2IWAHARA YUJI1
Top patents by PatentIndex Score
30 records- 0190US9841688B2Method for detecting overlay error and method for manufacturing semiconductor device using the sameKO KANG-WOONG·Filed 2015·Granted Dec 12, 2017·11 cites·20 claims
- 0290US5493401AMethod of measuring film thicknessesDAINIPPON SCREEN MFG·Filed 1994·Granted Feb 20, 1996·80 cites·4 claims
- 0387US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0487US5136149AMethod of focusing optical head on object body and automatic focusing device for optical inspection system including tilt detectionDAINIPPON SCREEN MFG·Filed 1991·Granted Aug 4, 1992·62 cites·17 claims
- 0586US5440141AMethod of measuring a thickness of a multilayered sample using ultraviolet light and light with wavelengths longer than ultravioletDAINIPPON SCREEN MFG·Filed 1994·Granted Aug 8, 1995·60 cites·7 claims
- 0685US7254318B2Recording apparatus, recording program, and recording methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 7, 2007·37 cites·14 claims
- 0784US5686993AMethod of and apparatus for measuring film thicknessDAINIPPON SCREEN MFG·Filed 1996·Granted Nov 11, 1997·62 cites·10 claims
- 0881US7710579B2Measuring method and apparatus for measuring depth of trench patternDAINIPPON SCREEN MFG·Filed 2007·Granted May 4, 2010·7 cites·32 claims
- 0979US7095498B2Spectroscopic ellipsometerDAINIPPON SCREEN MFG·Filed 2004·Granted Aug 22, 2006·23 cites·9 claims
- 1074US6879408B1Printer driver, printer, and recording medium on which printer driver program is recordedMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Apr 12, 2005·23 cites·48 claims
- 1170US6862095B2Method of measuring dielectric constant using light in a plurality of wavelength rangesDAINIPPON SCREEN MFG·Filed 2002·Granted Mar 1, 2005·8 cites·11 claims
- 1267US7177531B2Record and playback apparatus and record mediumMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Feb 13, 2007·7 cites·11 claims
- 1367US2025377369A1Container handling method and automatic measuring apparatusSHASHIN KAGAKU CO LTD·Filed 2022·Application pending·0 cites
- 1466US5841894AThree-dimensional detecting method and three-dimensional detecting apparatusDAINIPPON SCREEN MFG·Filed 1996·Granted Nov 24, 1998·29 cites·14 claims
- 1562US7929139B2Spectroscopic ellipsometer, film thickness measuring apparatus, and method of focusing in spectroscopic ellipsometerDAINIPPON SCREEN MFG·Filed 2008·Granted Apr 19, 2011·4 cites·10 claims
- 1661US7711249B2Recording/reproduction device and methodPANASONIC CORP·Filed 2003·Granted May 4, 2010·4 cites·18 claims
- 1760US7555199B2Recording apparatus, OSD controlling method, program, and recording mediumPANASONIC CORP·Filed 2004·Granted Jun 30, 2009·4 cites·13 claims
- 1859US6020968AMethod of and apparatus for inspecting residue of metal filmDAINIPPON SCREEN MFG·Filed 1999·Granted Feb 1, 2000·21 cites·12 claims
- 1959US5422703AReflected light measuring method and reflected light measuring apparatus for a microscopic photometric systemDAINIPPON SCREEN MFG·Filed 1994·Granted Jun 6, 1995·19 cites·11 claims
- 2050US6937333B2Apparatus for measuring film thickness formed on object, apparatus and method of measuring spectral reflectance of object, and apparatus and method of inspecting foreign material on objectDAINIPPON SCREEN MFG·Filed 2003·Granted Aug 30, 2005·7 cites·3 claims
- 2150US2009066953A1Spectroscopic ellipsometer and film thickness measuring apparatusDAINIPPON SCREEN MFG·Filed 2008·Application pending·0 cites
- 2246US2009119596A1Viewer device, slide show display method in viewer device, and programIWAHARA YUJI·Filed 2006·Application pending·0 cites
- 2345US2008243412A1Apparatus for Inspecting Defect and Method of Inspecting DefectDAINIPPON SCREEN MFG·Filed 2008·Application pending·0 cites
- 2445US2005178947A1System and method for object identificationMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 2543US2003059103A1Surface inspection of object using image processingDAINIPPON SCREEN MFG·Filed 2002·Application pending·0 cites
- 2641US2004047595A1Recording apparatus and computer-readable programFiled 2003·Application pending·0 cites
- 2738US2016055382A1Vehicle discrimination apparatusTOSHIBA KK·Filed 2015·Application pending·0 cites
- 2836US7612873B2Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring methodDAINIPPON SCREEN MFG·Filed 2007·Granted Nov 3, 2009·0 cites·20 claims
- 2934US2017200658A1Methods of inspecting substrates and semiconductor fabrication methods incorporating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
- 3033US2005006560A1Film forming apparatus and film forming methodDAINIPPON SCREEN MFG·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →