Inventor · disambiguated record
Matthew Steven Hyde
Also filed as: HYDE MATTHEW STEVEN
4 granted patents·1 pending application·3 citations·filing 2019–2024
59Inventor score
Technology areasG11C
Files withIBM5
Top patents by PatentIndex Score
5 records- 0168US10998075B2Built-in self-test for bit-write enabled memory arraysIBM·Filed 2019·Granted May 4, 2021·2 cites·20 claims
- 0261US11081202B2Failing address registers for built-in self testsIBM·Filed 2019·Granted Aug 3, 2021·1 cites·17 claims
- 0349US2025279148A1Reconfigurable testing of an integrated circuitIBM·Filed 2024·Application pending·0 cites
- 0445US11657887B2Testing bit write operation to a memory array in integrated circuitsIBM·Filed 2021·Granted May 23, 2023·0 cites·17 claims
- 0545US11069422B1Testing multi-port array in integrated circuitsIBM·Filed 2020·Granted Jul 20, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →