Inventor · disambiguated record

Mario Iodice

Also filed as: IODICE MARIO

1 granted patent·3 citations·filing 2003–2003

20Inventor score

Technology areasG01N

Files withCONSIGLIO NAZIONALE RICERCHE1

Top patents by PatentIndex Score

1 record

0153US7046373B2Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedureCONSIGLIO NAZIONALE RICERCHE·Filed 2003·Granted May 16, 2006·3 cites·7 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →