Inventor · disambiguated record
Marcin Janaszewski
Also filed as: JANASZEWSKI MARCIN
2 granted patents·1 citations·filing 2014–2018
29Inventor score
Technology areasH01J
Files withZEISS CARL MICROSCOPY GMBH2
Top patents by PatentIndex Score
2 records- 0158US9558911B2Method for analyzing and/or processing an object as well as a particle beam device for carrying out the methodZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Jan 31, 2017·1 cites·28 claims
- 0240US10468231B1Methods of operating particle microscopes and particle microscopesZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Nov 5, 2019·0 cites·31 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →