Inventor · disambiguated record
Masahiro Kanazawa
Also filed as: KANAZAWA MASAHIRO
14 granted patents·2 pending applications·314 citations·filing 1992–2006
93Inventor score
Top patents by PatentIndex Score
16 records- 0193US6813750B2Logic circuit design equipment and method for designing logic circuit for reducing leakage currentTOSHIBA KK·Filed 2002·Granted Nov 2, 2004·105 cites·20 claims
- 0289US6586982B2Semiconductor circuit having a combination circuit being switched between an active and inactive stateTOSHIBA KK·Filed 2001·Granted Jul 1, 2003·28 cites·9 claims
- 0382US6493856B2Automatic circuit generation apparatus and method, and computer program product for executing the methodTOSHIBA KK·Filed 2001·Granted Dec 10, 2002·37 cites·15 claims
- 0482US5920089AMulti-power supply integrated circuit and system employing the sameTOSHIBA KK·Filed 1997·Granted Jul 6, 1999·55 cites·31 claims
- 0572US6750680B2Semiconductor integrated circuit, logic operation circuit, and flip flopTOSHIBA KK·Filed 2001·Granted Jun 15, 2004·16 cites·13 claims
- 0661US5362951AMagnetic card reader equipped with head reversing functionAMANO CORP·Filed 1992·Granted Nov 8, 1994·27 cites·5 claims
- 0758US6864720B2Semiconductor integrated circuit and circuit designating systemTOSHIBA KK·Filed 2003·Granted Mar 8, 2005·6 cites·12 claims
- 0856US7216329B2Automatic circuit design apparatus, method for automatically designing a circuit, and computer program product for executing an application for an automatic circuit design apparatusTOSHIBA KK·Filed 2004·Granted May 8, 2007·5 cites·20 claims
- 0951US6097043ASemiconductor integrated circuit and supply method for supplying multiple supply voltages in a semiconductor integrated circuitTOSHIBA KK·Filed 1997·Granted Aug 1, 2000·17 cites·7 claims
- 1045US7109771B2Semiconductor integrated circuit with reduced leakage currentTOSHIBA KK·Filed 2004·Granted Sep 19, 2006·2 cites·5 claims
- 1145US7088161B2Semiconductor integrated circuit with reduced leakage currentTOSHIBA KK·Filed 2004·Granted Aug 8, 2006·2 cites·6 claims
- 1245US6683336B1Semiconductor integrated circuit, supply method for supplying multiple supply voltages in semiconductor integrated circuit, and record medium for storing program of supply method for supplying multiple supply voltages in semiconductor integrated circuitTOSHIBA KK·Filed 2000·Granted Jan 27, 2004·2 cites·2 claims
- 1342US2006177808A1Apparatus for ability evaluation, method of evaluating ability, and computer program product for ability evaluationCSK HOLDINGS CORP·Filed 2006·Application pending·0 cites
- 1439US6266798B1Multi-power supply integrated circuit evaluation system and method of operating the sameTOSHIBA KK·Filed 1999·Granted Jul 24, 2001·12 cites·20 claims
- 1536US6861882B2Semiconductor integrated circuit with reduced leakage currentTOSHIBA KK·Filed 2003·Granted Mar 1, 2005·0 cites·10 claims
- 1635US2003088836A1Low power test circuit and a semiconductor integrated circuit with the low power test circuitTOSHIBA KK·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →