Inventor · disambiguated record
Masahiro Kanno
Also filed as: KANNO MASAHIRO
15 granted patents·10 pending applications·151 citations·filing 1993–2024
90Inventor score
Top patents by PatentIndex Score
25 records- 0183US6620334B2Etching apparatus and etching methodTOSHIBA KK·Filed 2002·Granted Sep 16, 2003·36 cites·9 claims
- 0281US5602567ADisplay monitorMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Feb 11, 1997·67 cites·8 claims
- 0377US9073284B2Method of forming pattern and laminateHIENO ATSUSHI·Filed 2012·Granted Jul 7, 2015·3 cites·19 claims
- 0474US8986488B2Pattern formation method and polymer alloy base materialTOSHIBA KK·Filed 2013·Granted Mar 24, 2015·3 cites·13 claims
- 0574US2024336810A1Polishing liquid for cmp, polishing liquid set for cmp and polishing methodRESONAC CORP·Filed 2022·Application pending·0 cites
- 0674US2025115795A1Polishing liquid for cmp, polishing liquid set for cmp, and polishing methodRESONAC CORP·Filed 2022·Application pending·0 cites
- 0774US2024336809A1Polishing liquid for cmp, polishing liquid set for cmp, and polishing methodRESONAC CORP·Filed 2022·Application pending·0 cites
- 0872US7883824B2Method for evaluating lithography apparatus and method for controlling lithography apparatusTOSHIBA KK·Filed 2009·Granted Feb 8, 2011·3 cites·12 claims
- 0971US5654749AImage display apparatusMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Aug 5, 1997·37 cites·7 claims
- 1071US2025043096A1Method for producing low-molecular-weight fluorine compoundDAIKIN IND LTD·Filed 2024·Application pending·0 cites
- 1161US9291908B2Method of forming pattern and laminateTOSHIBA KK·Filed 2015·Granted Mar 22, 2016·0 cites·16 claims
- 1250US12366511B2Moisture meter, state diagnosis method for moisture meter, and storage mediumA&D CO LTD·Filed 2020·Granted Jul 22, 2025·0 cites·6 claims
- 1349US10352839B2Method and device for measuring physical properties of fluidA&D CO LTD·Filed 2014·Granted Jul 16, 2019·0 cites·2 claims
- 1446US10366886B2Pattern forming method, self-organization material, and method of manufacturing semiconductor apparatusTOSHIBA MEMORY CORP·Filed 2017·Granted Jul 30, 2019·0 cites·10 claims
- 1546US7079219B2Method for manufacturing semiconductor device and exposure systemTOSHIBA KK·Filed 2004·Granted Jul 18, 2006·2 cites·14 claims
- 1646US2023217559A1Microwave processing device, and microwave processing methodMICROWAVE CHEMICAL CO LTD·Filed 2021·Application pending·0 cites
- 1745US2015377759A1Method for finding shear rate of fluid, and program and device for sameA&D CO LTD·Filed 2013·Application pending·0 cites
- 1843US10474028B2Template, method for fabricating template, and method for manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Nov 12, 2019·0 cites·13 claims
- 1943US2008199368A1Night soil drying treatment apparatusKANNO MASAHIRO·Filed 2007·Application pending·0 cites
- 2041US2014248439A1Pattern formation methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2136US10871392B2Protective cover for weighing instrument with suspended sliding doorA&D CO LTD·Filed 2016·Granted Dec 22, 2020·0 cites·9 claims
- 2236US8173061B2Pattern transfer methodKANNO MASAHIRO·Filed 2010·Granted May 8, 2012·0 cites·14 claims
- 2336US2007212801A1System for adjusting manufacturing equipment, method for adjusting manufacturing equipment, and method for manufacturing semiconductor deviceKANNO MASAHIRO·Filed 2007·Application pending·0 cites
- 2434US8808973B2Method of forming patternMIKOSHIBA SATOSHI·Filed 2012·Granted Aug 19, 2014·0 cites·6 claims
- 2528US2011111593A1Pattern formation method, pattern formation system, and method for manufacturing semiconductor deviceKANNO MASAHIRO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →