Inventor · disambiguated record
Masanari Koguchi
Also filed as: KOGUCHI MASANARI
23 granted patents·7 pending applications·731 citations·filing 1991–2023
96Inventor score
Top patents by PatentIndex Score
30 records- 0195US6838667B2Method and apparatus for charged particle beam microscopyHITACHI LTD·Filed 2001·Granted Jan 4, 2005·59 cites·17 claims
- 0294US7417227B2Scanning interference electron microscopeHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 26, 2008·22 cites·16 claims
- 0392US7372029B2Scanning transmission electron microscope and scanning transmission electron microscopyHITACHI HIGH TECH CORP·Filed 2007·Granted May 13, 2008·15 cites·8 claims
- 0492US7372051B2Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement systemHITACHI HIGH TECH CORP·Filed 2005·Granted May 13, 2008·19 cites·10 claims
- 0592US6570156B1Autoadjusting electron microscopeHITACHI LTD·Filed 2000·Granted May 27, 2003·100 cites·11 claims
- 0692US5362972ASemiconductor device using whiskersHITACHI LTD·Filed 1991·Granted Nov 8, 1994·192 cites·48 claims
- 0791US5866905AElectron microscopeHITACHI LTD·Filed 1996·Granted Feb 2, 1999·74 cites·12 claims
- 0890US6051834AElectron microscopeHITACHI LTD·Filed 1998·Granted Apr 18, 2000·65 cites·2 claims
- 0989US6750451B2Observation apparatus and observation method using an electron beamHITACHI LTD·Filed 2002·Granted Jun 15, 2004·32 cites·5 claims
- 1088US7633064B2Electric charged particle beam microscopy and electric charged particle beam microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Dec 15, 2009·11 cites·13 claims
- 1184US7227144B2Scanning transmission electron microscope and scanning transmission electron microscopyHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 5, 2007·7 cites·10 claims
- 1281US9752997B2Charged-particle-beam analysis device and analysis methodHITACHI LTD·Filed 2014·Granted Sep 5, 2017·4 cites·15 claims
- 1379US8334519B2Multi-part specimen holder with conductive patternsONO SHIANO·Filed 2007·Granted Dec 18, 2012·11 cites·15 claims
- 1478US5552602AElectron microscopeHITACHI LTD·Filed 1995·Granted Sep 3, 1996·41 cites·28 claims
- 1576US6888139B2Electron microscopeHITACHI LTD·Filed 2003·Granted May 3, 2005·28 cites·4 claims
- 1674US9601308B2Spectroscopic element and charged particle beam device using the sameHITACHI LTD·Filed 2012·Granted Mar 21, 2017·3 cites·11 claims
- 1772US5932880AScintillator device and image pickup apparatus using the sameHITACHI LTD·Filed 1997·Granted Aug 3, 1999·24 cites·18 claims
- 1870US7518111B1Magnetic electron microscopeHITACHI LTD·Filed 2006·Granted Apr 14, 2009·2 cites·6 claims
- 1968US2023303961A1Sample measurement apparatus, sample measurement system, and artificial insemination apparatusHITACHI LTD·Filed 2023·Application pending·0 cites
- 2064US8481932B2Charged particle beam analyzer and analysis methodANAN YOSHIHIRO·Filed 2012·Granted Jul 9, 2013·2 cites·11 claims
- 2163US5717207ATransmission electron microscope with camera systemHITACHI LTD·Filed 1996·Granted Feb 10, 1998·16 cites·30 claims
- 2260US7141790B2Defect inspection instrument and positron beam apparatusHITACHI LTD·Filed 2004·Granted Nov 28, 2006·4 cites·11 claims
- 2358US2024126061A1Scanning probe microscopeHITACHI LTD·Filed 2023·Application pending·0 cites
- 2456US2024280606A1Detection probe, probe microscope, and sample temperature measuring methodHITACHI LTD·Filed 2022·Application pending·0 cites
- 2554US10088450B2Method for evaluating structural change during production process, and analysis programHITACHI LTD·Filed 2014·Granted Oct 2, 2018·0 cites·6 claims
- 2654US2002099573A1Network solution system of analysis and evaluationHITACHI LTD·Filed 2002·Application pending·0 cites
- 2751US2008283748A1Electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 2849US2011049344A1Diffraction pattern capturing method and charged particle beam deviceHITACHI LTD·Filed 2009·Application pending·0 cites
- 2942US2015293040A1Calculation system and calculation methodHITACHI LTD·Filed 2012·Application pending·0 cites
- 3038US10627354B2Substitution site measuring equipment and substitution site measuring methodHITACHI LTD·Filed 2016·Granted Apr 21, 2020·0 cites·13 claims
Join the waitlist — get patent alerts
Get an alert when Masanari Koguchi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →