Inventor · disambiguated record
Makiko Kohno
Also filed as: KOHNO MAKIKO
7 granted patents·344 citations·filing 1991–1995
88Inventor score
Files withHITACHI LTD7
Top patents by PatentIndex Score
7 records- 0190US5233191AMethod and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production processHITACHI LTD·Filed 1991·Granted Aug 3, 1993·145 cites·14 claims
- 0289US5333495AMethod and apparatus for processing a minute portion of a specimenHITACHI LTD·Filed 1993·Granted Aug 2, 1994·76 cites·8 claims
- 0386US5214282AMethod and apparatus for processing a minute portion of a specimenHITACHI LTD·Filed 1991·Granted May 25, 1993·58 cites·69 claims
- 0474US5585722AApparatus for measuring physical properties of micro areaHITACHI LTD·Filed 1994·Granted Dec 17, 1996·36 cites·8 claims
- 0550US5746826AMethod and apparatus for forming microstructure bodyHITACHI LTD·Filed 1994·Granted May 5, 1998·20 cites·40 claims
- 0634US5218335AElectronic circuit device having thin film resistor and method for producing the sameHITACHI LTD·Filed 1991·Granted Jun 8, 1993·6 cites·31 claims
- 0733US5698798AMethod and apparatus for dynamic observation of specimenHITACHI LTD·Filed 1995·Granted Dec 16, 1997·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →