Inventor · disambiguated record
Masahiro Koike
Also filed as: KOIKE MASAHIRO
66 granted patents·12 pending applications·740 citations·filing 1985–2023
99Inventor score
Top patents by PatentIndex Score
78 records- 0193US8527610B2Cache server control device, content distribution system, method of distributing content, and programKOIKE MASAHIRO·Filed 2011·Granted Sep 3, 2013·51 cites·11 claims
- 0292US7171854B2Nondestructive inspection apparatus and nondestructive inspection method using elastic guided waveHITACHI LTD·Filed 2004·Granted Feb 6, 2007·54 cites·18 claims
- 0392US7093490B2Ultrasonic flaw detecting method and ultrasonic flaw detectorHITACHI LTD·Filed 2005·Granted Aug 22, 2006·22 cites·6 claims
- 0492US6255031B1Near infrared absorbing film, and multi-layered panel comprising the filmKANEBO LTD·Filed 1997·Granted Jul 3, 2001·122 cites·14 claims
- 0590US11610617B2Magnetic memoryKIOXIA CORP·Filed 2021·Granted Mar 21, 2023·2 cites·22 claims
- 0690US10080076B2Headphone deviceSINTAI OPTICAL SHENZHEN CO LTD·Filed 2017·Granted Sep 18, 2018·10 cites·19 claims
- 0790US10036660B2Measurement device having variable opening orifice for measuring airflow volume and ventilation resistance of wind blowing apparatusSANYO ELECTRIC CO·Filed 2016·Granted Jul 31, 2018·7 cites·11 claims
- 0890US5748496ADiagnosis systemHITACHI LTD·Filed 1996·Granted May 5, 1998·37 cites·17 claims
- 0990US5663502AMethod and apparatus for measuring thickness of layer using acoustic wavesHITACHI LTD·Filed 1995·Granted Sep 2, 1997·116 cites·8 claims
- 1088US8616062B2Ultrasonic inspection system and ultrasonic inspection methodKONO NAOYUKI·Filed 2011·Granted Dec 31, 2013·13 cites·15 claims
- 1188US7235967B2Eddy current testing probe and eddy current testing apparatusHITACHI LTD·Filed 2006·Granted Jun 26, 2007·13 cites·13 claims
- 1285US7841237B2Ultrasonic testing apparatus for turbine forks and method thereofHITACHI LTD·Filed 2007·Granted Nov 30, 2010·13 cites·7 claims
- 1384US8616864B2Axial flow fanNAKAMURA TOSHIYUKI·Filed 2009·Granted Dec 31, 2013·13 cites·3 claims
- 1481US7279737B2Nonvolatile semiconductor memory device and method of manufacturing the sameTOSHIBA KK·Filed 2005·Granted Oct 9, 2007·11 cites·4 claims
- 1581US6957583B2Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection methodHITACHI LTD·Filed 2003·Granted Oct 25, 2005·24 cites·20 claims
- 1678US6060403AMethod of manufacturing semiconductor deviceTOSHIBA KK·Filed 1998·Granted May 9, 2000·49 cites·20 claims
- 1777US8154072B2Nonvolatile semiconductor memory apparatusKOIKE MASAHIRO·Filed 2009·Granted Apr 10, 2012·7 cites·10 claims
- 1877US7448861B2Resin molded semiconductor device and moldNEC ELECTRONICS CORP·Filed 2005·Granted Nov 11, 2008·7 cites·18 claims
- 1976US7911206B2Method and apparatus for evaluating length of defect in eddy current testingHITACHI LTD·Filed 2007·Granted Mar 22, 2011·4 cites·7 claims
- 2076US7872472B2Eddy current testing apparatus and eddy current testing methodHITACHI LTD·Filed 2009·Granted Jan 18, 2011·4 cites·6 claims
- 2175US11232822B2Magnetic memory with circuit to supply shift pulse to move a domain wall in a magnetic bodyKIOXIA CORP·Filed 2020·Granted Jan 25, 2022·1 cites·13 claims
- 2275US8058736B2Semiconductor device having heat spreader with center openingKOIKE MASAHIRO·Filed 2007·Granted Nov 15, 2011·7 cites·19 claims
- 2374US6326670B1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2000·Granted Dec 4, 2001·18 cites·20 claims
- 2473US7772840B2Eddy current testing methodHITACHI LTD·Filed 2009·Granted Aug 10, 2010·3 cites·14 claims
- 2573US7358721B2Eddy current flaw detection sensor and methodHITACHI LTD·Filed 2007·Granted Apr 15, 2008·5 cites·15 claims
- 2673US5886198AMethod for continuously producing a cyclic formalTORAY INDUSTRIES·Filed 1998·Granted Mar 23, 1999·15 cites·21 claims
- 2771US10707356B2Magnetic memory device and manufacturing method of the sameTOSHIBA MEMORY CORP·Filed 2019·Granted Jul 7, 2020·1 cites·15 claims
- 2870US5378739AEmulsion ink for use in stencil printingRICOH KK·Filed 1992·Granted Jan 3, 1995·26 cites·4 claims
- 2969US9304113B2Heat-resistant ultrasonic sensor and installation method thereofBABA ATSUSHI·Filed 2012·Granted Apr 5, 2016·1 cites·12 claims
- 3069US7943984B2Nonvolatile semiconductor memory apparatusTOSHIBA KK·Filed 2008·Granted May 17, 2011·4 cites·20 claims
- 3169US6717279B2Semiconductor device with recessed portion in the molding resinNEC CORP·Filed 2002·Granted Apr 6, 2004·13 cites·6 claims
- 3268US8995602B2Method of checking installed state of jet pump beamBABA ATSUSHI·Filed 2012·Granted Mar 31, 2015·1 cites·7 claims
- 3367US9096192B2AirbagNIHON PLAST CO LTD·Filed 2013·Granted Aug 4, 2015·3 cites·4 claims
- 3466US7300838B2Semiconductor device and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2006·Granted Nov 27, 2007·2 cites·12 claims
- 3564US9145896B2Axial flow fanSANYO ELECTRIC CO·Filed 2013·Granted Sep 29, 2015·1 cites·3 claims
- 3664US9120185B2Workpiece support apparatusHONDA MOTOR CO LTD·Filed 2013·Granted Sep 1, 2015·1 cites·3 claims
- 3757US11198168B2Bending method and apparatus for the sameHONDA MOTOR CO LTD·Filed 2019·Granted Dec 14, 2021·0 cites·16 claims
- 3854US11915928B2Semiconductor memory device and method of manufacturing the sameKIOXIA CORP·Filed 2021·Granted Feb 27, 2024·0 cites·7 claims
- 3954US9014531B2Time-shifted viewing system, time-shifted viewing method, and time-shifted viewing apparatus and programGOKURAKUJI JUNICHI·Filed 2010·Granted Apr 21, 2015·1 cites·5 claims
- 4053US8356833B2Airbag device and production method thereofNIHON PLAST CO LTD·Filed 2009·Granted Jan 22, 2013·0 cites·6 claims
- 4153US2003167150A1Data administration method in power-generating plantFiled 2003·Application pending·0 cites
- 4253US2008079426A1Eddy current testing apparatus and eddy current testing methodSUZUKI YUTAKA·Filed 2007·Application pending·0 cites
- 4352US12419198B2Magnetic memoryKIOXIA CORP·Filed 2023·Granted Sep 16, 2025·0 cites·17 claims
- 4451US9686868B2Method of removing soluble material layer by dissolving, method of manufacturing member, socket for use in electronic part, and electric and electronic devicesALPS ELECTRIC CO LTD·Filed 2016·Granted Jun 20, 2017·0 cites·5 claims
- 4551US8339130B2Method and apparatus for evaluating length of defect in eddy current testingNISHIMIZU AKIRA·Filed 2011·Granted Dec 25, 2012·0 cites·5 claims
- 4651US7053455B2Semiconductor device and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2004·Granted May 30, 2006·3 cites·13 claims
- 4750US7348644B2Semiconductor device and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2006·Granted Mar 25, 2008·0 cites·16 claims
- 4849US9082518B2Nuclear reactor vibration monitoring apparatus and method of monitoring nuclear reactor vibrationHITACHI GE NUCLEAR ENERGY LTD·Filed 2012·Granted Jul 14, 2015·0 cites·14 claims
- 4949US2007134149A1Spheroidizing agent of graphiteASAHI TEC CORP·Filed 2006·Application pending·0 cites
- 5048US9581174B2Fan frameSANYO ELECTRIC CO·Filed 2013·Granted Feb 28, 2017·0 cites·14 claims
Showing the top 50 of 78 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →