Inventor · disambiguated record
Masaaki Komori
Also filed as: KOMORI MASAAKI
18 granted patents·1 pending application·241 citations·filing 1990–2018
93Inventor score
Top patents by PatentIndex Score
19 records- 0194US5151122AProcess for producing an antibacterial ceramic materialSANGI KK·Filed 1990·Granted Sep 29, 1992·82 cites·4 claims
- 0287US10746171B2Control device for electric motor and hydraulic pressure supply systemMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Aug 18, 2020·4 cites·5 claims
- 0387US6546034B2Semiconductor laser device, semiconductor laser array device and optical fiber transmission systemHITACHI LTD·Filed 2000·Granted Apr 8, 2003·28 cites·13 claims
- 0484US5266534AAntibacterial calcium phosphate ceramicSANGI KK·Filed 1992·Granted Nov 30, 1993·37 cites·9 claims
- 0582US7663104B2Specimen inspection equipment and how to make electron beam absorbed current imagesHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·6 cites·8 claims
- 0675US5764842ASemiconductor guided-wave optical device and method of fabricating thereofHITACHI LTD·Filed 1996·Granted Jun 9, 1998·44 cites·15 claims
- 0774US6606443B2Optical transmission deviceHITACHI LTD·Filed 2002·Granted Aug 12, 2003·11 cites·5 claims
- 0870US8040146B2Inspection apparatus having a heating mechanism for performing sample temperature regulationHITACHI HIGH TECH CORP·Filed 2010·Granted Oct 18, 2011·2 cites·20 claims
- 0970US7663390B2Inspection apparatus and methodHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·5 cites·13 claims
- 1069US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 1158US11391756B2Probe module and probeHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 19, 2022·0 cites·13 claims
- 1257US5348577AAntibacterial calcium tertiary phosphateSANGI KK·Filed 1992·Granted Sep 20, 1994·8 cites·4 claims
- 1348US11513138B2Semiconductor inspection device and probe unitHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 29, 2022·0 cites·15 claims
- 1448US6459840B1Optical transmission deviceHITACHI LTD·Filed 1999·Granted Oct 1, 2002·12 cites·15 claims
- 1547US10782340B2Dynamic response analysis prober deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 22, 2020·0 cites·8 claims
- 1646US11709199B2Evaluation apparatus for semiconductor deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 25, 2023·0 cites·5 claims
- 1744US11719746B2Semiconductor inspection deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Aug 8, 2023·0 cites·17 claims
- 1843US11977099B2Method for manufacturing semiconductor deviceHITACHI HIGH TECH CORP·Filed 2018·Granted May 7, 2024·0 cites·7 claims
- 1933US2011291692A1Method and apparatus for inspecting semiconductor using absorbed current imageANDO TOHRU·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Masaaki Komori files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →