Inventor · disambiguated record
Marc Kryger
Also filed as: KRYGER MARC · KRYGER MARC CHRISTOPHER
11 granted patents·7 pending applications·117 citations·filing 2015–2025
92Inventor score
Files withFEMTOMETRIX INC18
Top patents by PatentIndex Score
18 records- 0198US12241924B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2022·Granted Mar 4, 2025·3 cites·19 claims
- 0298US11821911B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2021·Granted Nov 21, 2023·6 cites·6 claims
- 0398US11293965B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2020·Granted Apr 5, 2022·12 cites·14 claims
- 0498US11150287B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2020·Granted Oct 19, 2021·9 cites·16 claims
- 0598US10663504B2Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2017·Granted May 26, 2020·14 cites·23 claims
- 0697US11988611B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2021·Granted May 21, 2024·4 cites·18 claims
- 0797US10613131B2Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2018·Granted Apr 7, 2020·15 cites·22 claims
- 0897US10591525B2Wafer metrology technologiesFEMTOMETRIX INC·Filed 2017·Granted Mar 17, 2020·15 cites·32 claims
- 0996US11415617B2Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2019·Granted Aug 16, 2022·9 cites·12 claims
- 1096US11199507B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2019·Granted Dec 14, 2021·11 cites·9 claims
- 1196US10551325B2Systems for parsing material properties from within SHG signalsFEMTOMETRIX INC·Filed 2015·Granted Feb 4, 2020·19 cites·8 claims
- 1282US2025093277A1Systems for parsing material properties from within shg signalsFEMTOMETRIX INC·Filed 2024·Application pending·0 cites
- 1379US2025155486A1Wafer metrology technologiesFEMTOMETRIX INC·Filed 2025·Application pending·0 cites
- 1466US2018292441A1Charge decay measurement systems and methodsFEMTOMETRIX INC·Filed 2018·Application pending·0 cites
- 1560US2015331036A1Field-biased second harmonic generation metrologyFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 1660US2015330908A1Pump and probe type second harmonic generation metrologyFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 1760US2015330909A1Wafer metrology techonologiesFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
- 1860US2015331029A1Charge decay measurement systems and methodsFEMTOMETRIX INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →